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Applications

Home / Applications / NFS

  • Industry

  • Technique

Technique Title

NFS

Contaminant Identification on Circuit Boards Using a Near-Field IR Spectrometer

Contaminant Identification on Circuit Boards Using a Near-Field IR Spectrometer
Leah Pandiscia, PhD May 4, 2017

NFS

Evaluation of a Luminescent Semiconductor on the Nanometer Scale

Evaluation of a Luminescent Semiconductor on the Nanometer Scale
Leah Pandiscia, PhD May 4, 2017

NFS

Infrared measurements with 1 µm spatial resolution

Infrared measurements with 1 µm spatial resolution
Leah Pandiscia, PhD May 4, 2017

NFS

Optical Evaluation of Write Spots in a CD-R by Transmittance Measurement

Optical Evaluation of Write Spots in a CD-R by Transmittance Measurement
Leah Pandiscia, PhD May 4, 2017

NFS

Nanometer scale characterization of a GaAsP semiconductor

Nanometer scale characterization of a GaAsP semiconductor
Leah Pandiscia, PhD May 4, 2017

NFS

Measurement of the Transition Process of a Semiconductor

Measurement of the Transition Process of a Semiconductor
Leah Pandiscia, PhD May 4, 2017

NFS

Nanospectroscopy using a Near-Field Scanning Microspectrometer

Nanospectroscopy using a Near-Field Scanning Microspectrometer
Leah Pandiscia, PhD May 4, 2017

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