Linear and Non-linear Optical Parameters of Diluted Magnetic Semiconductor CdS0.9Mn0.1 Thin Film: Influence of the Film Thickness

March 24, 2020

Title

Linear and Non-linear Optical Parameters of Diluted Magnetic Semiconductor CdS0.9Mn0.1 Thin Film: Influence of the Film Thickness

Author

A. M. Abdelraheem, M. I. Abd-Elrahman, Mansour Mohamed, N. M. A. Hadia, E. R. Shaaban

Year

2020

Journal

Journal of Electronic Materials

Abstract

The optical properties of CdS0.9Mn0.1 thin film with different thicknesses (d = 300, 450, 600, 750, 900 and 1000 nm) were explored. The Swanepoel method was employed to calculate the thickness of the studied films. Analyses of the absorption spectra indicated the existence of allowed indirect and direct transition mechanism in the CdS0.9Mn0.1 thin films. Both the absorption coefficient and optical band gap decreased while Urbach energy increased as the film thickness increased. The Wimple–DiDomenico single oscillator model was used to describe the dispersion of the refractive index. The film thickness dependence of the dispersion parameters was studied. The optical dielectric constants, optical conductivity, electrical susceptibility, and non-liner optical parameters such as the refractive index, first-order susceptibility (

Instrument

V-670

Keywords

Absorption, Transmittance, Reflectance, Solid state, Film thickness, Band gap, Materials, Optical properties