V-730 UV-Visible Spectrophotometer
| Optical System | Rowland off-circle arrangement Single monochromator Double beam type |
| Light source | Halogen lamp, Deuterium lamp |
| Wavelength range | 190 to 1,100 nm |
| Wavelength accuracy | +/-0.2 nm (at 656.1 nm) |
| Wavelength repeatability | +/-0.1 nm |
| Spectral bandwidth (SBW) | 1 nm |
| Stray light | 1 % (198 nm KCL 12 g/L aqueous solution) 0.02 % (220 nm NaI 10 g/L aqueous solution) 0.02 % (340 nm NaNO2 50 g/L aqueous solution) 0.02 % (370 nm NaNO2 50 g/L aqueous solution) SBW: 1 nm |
| Photometric range | -3~3 Abs |
| Photometric accuracy | +/-0.0015 Abs (0 to 0.5 Abs) +/-0.0025 Abs (0.5 to 1 Abs) +/-0.3 %T Tested with NIST SRM 930D |
| Photometric repeatability | +/-0.0005 Abs (0 to 0.5 Abs) +/-0.0005 Abs (0.5 to 1 Abs) Tested with NIST SRM 930D |
| Scanning speed | 10-8000 nm/min |
| Slew speed | 24,000 nm/min |
| RMS noise | 0.00004 Abs (0 Abs, wavelength: 500 nm, measurement time: 60 sec, SBW: 1 nm) |
| Baseline stability | 0.0004 Abs/hour (Value obtained more than one hour after turning on the source, when the room temperature is stabilized, wavelength: 250 nm, response: slow) |
| Baseline flatness | +/-0.0005 Abs (200 - 1,000 nm) |
| Detector | Silicon photodiode |
| Standard functions | IQ accessories, Start button, Analog output |
| Standard programs | Abs/%T meter, Quantitative analysis, Spectrum measurement, Time course measurement, Fixed wavelength measurement, Validation, Daily maintenance, Two wavelength time course measurement |
| Dimensions and weight | 486(W) x 441(D) x 216(H) mm, 15 kg |
| Power requirements | 120 VA |
| Installation requirements | Room temperature: 15-30 Celsius, humidity: below 85% |
V-750 UV-Visible Spectrophotometer
| Optical System | Czerny-Turner mount Single monochromator Fully symmetrical double beam type |
| Light Source | Halogen lamp, Deuterium lamp |
| Wavelength range | 190 to 900 nm |
| Wavelength accuracy | +/-0.2 nm (at 656.1 nm) |
| Wavelength repeatability | +/-0.05 nm |
| Spectral bandwidth (SBW) | 0.1, 0.2, 0.5, 1, 2, 5, 10 nm L2, L5, L10 nm (low stray light mode) M1, M2 nm (micro cell mode) |
| Stray light | 1 % (198 nm KCL 12 g/L aqueous solution) 0.005 % (220 nm NaI 10 g/L aqueous solution) 0.005 % (340 nm NaNO2 50 g/L aqueous solution) 0.005 % (370 nm NaNO2 50 g/L aqueous solution) SBW: L2 nm |
| Photometric range | -4~4 Abs |
| Photometric accuracy | +/-0.0015 Abs (0 to 0.5 Abs) +/-0.0025 Abs (0.5 to 1 Abs) +/-0.3 %T Tested with NIST SRM 930D |
| Photometric repeatability | +/-0.0005 Abs (0 to 0.5 Abs) +/-0.0005 Abs (0.5 to 1 Abs) Tested with NIST SRM 930D |
| Scanning speed | 10~4000 nm/min (8,000 nm/min in preview mode) |
| Slew speed | 12,000 nm/min |
| RMS noise | 0.00003 Abs (0 Abs, wavelength: 500 nm, measurement time: 60 sec, SBW: 2 nm) |
| Baseline stability | 0.0003 Abs/hour (Wavelength: 250 nm, response: slow and SBW: 2 nm) |
| Baseline flatness | +/-0.0002 Abs (200 - 850 nm) |
| Detector | Photomultiplier tube |
| Standard functions | IQ Accessory, Start Button, Analog output |
| Standard programs | Abs/%T meter, Quantitative analysis, Spectrum measurement, Time course measurement, Fixed wavelength measurement, Validation, Daily Check Two wavelength time course measurement |
| Dimensions and weight | 460(W) x 602(D) x 268(H) mm, 27 kg |
| Power requirements | 150 VA |
| Installation requirements | Room temperature: 15-30 Celsius, humidity: below 85% |
V-760 UV-Visible Spectrophotometer
| Optical System | Czerny-Turner mount Double monochromator Fully symmetrical double beam type |
| Light Source | Halogen lamp, Deuterium lamp |
| Wavelength range | 187 to 900 nm |
| Wavelength accuracy | +/-0.1 nm (at 656.1 nm) |
| Wavelength repeatability | +/-0.05 nm |
| Spectral bandwidth (SBW) | 0.1, 0.2, 0.5, 1, 5, 2, 10 nm L2, L5, L10 nm (low stray light mode) M1, M2 nm (micro cell mode) |
| Stray light | 1 % (198 nm KCL 12 g/L aqueous solution) 0.00008 % (220 nm NaI 10 g/L aqueous solution) 0.00008 % (340 nm NaNO2 50 g/L aqueous solution) 0.00008 % (370 nm NaNO2 50 g/L aqueous solution) SBW: L2 nm |
| Photometric range | -4~6 Abs |
| Photometric accuracy | +/-0.0015 Abs (0 to 0.5 Abs) +/-0.0025 Abs (0.5 to 1 Abs) +/-0.3 %T Tested with NIST SRM 930D |
| Photometric repeatability | +/-0.0005 Abs (0 to 0.5 Abs) +/-0.0005 Abs (0.5 to 1 Abs) Tested with NIST SRM 930D |
| Scanning speed | 10~4000 nm/min (8,000 nm/min in preview mode) |
| Slew speed | 12,000 nm/min |
| RMS noise | 0.00003 Abs (0 Abs, wavelength: 500 nm, measurement time: 60 sec, SBW: 2 nm) |
| Baseline stability | 0.0003 Abs/hour (Wavelength: 250 nm, response: slow and SBW: 2 nm) |
| Baseline flatness | +/-0.0003 Abs (200 - 800 nm) |
| Detector | Photomultiplier tube |
| Standard functions | IQ Accessory, Start Button, Analog output |
| Standard programs | Abs/%T meter, Quantitative analysis, Spectrum measurement, Time course measurement, Fixed wavelength measurement, Validation, Daily Check Two wavelength time course measurement |
| Dimensions and Weight | 460(W) x 602(D) x 268(H) mm, 29 kg |
| Power requirements | 150 VA |
| Installation requirements | Room temperature: 15-30 Celsius, humidity: below 85% |
V-770 UV-Visible Spectrophotometer
| Optical System | Czerny-Turner grating mount Single monochromator Fully symmetrical double-beam |
| Light Source | Halogen lamp, Deuterium lamp |
| Wavelength range | 190 to 2,700 nm (3,200 nm, option) |
| Wavelength accuracy | +/-0.3 nm (at 656.1 nm) +/-1.5 nm (at 1,312.2 nm) |
| Wavelength repeatability | +/-0.05 nm (UV-Vis), +/-0.2 nm (NIR) |
| Spectral bandwidth (SBW) | UV-Visible: 0.1, 0.2, 0.5, 1, 2, 5, 10 nm L2, L5, L10 nm (low stray light mode) M1, M2 nm (micro cell mode) NIR: 0.4, 0.8, 1, 2, 4, 8, 20, 40 L8, L20, L40 nm (low stray light mode) M4, M8 nm (micro cell mode) |
| Stray light | 1 % (198 nm KCL) 0.005 % (220 nm NaI) 0.005 % (340 nm NaNO2) 0.005 % (370 nm NaNO2) SBW: L2 nm 0.04 % (1420 nm: H2O) 0.1 % (1690 nm: CH2Br2) SBW: L8 nm |
| Photometric range | UV-Visible: -4~4 Abs NIR: -3~3 Abs |
| Photometric accuracy | +/-0.0015 Abs (0 to 0.5 Abs) +/-0.0025 Abs (0.5 to 1 Abs) +/-0.3 %T Tested with NIST SRM 930D |
| Photometric repeatability | +/-0.0005 Abs (0 to 0.5 Abs) +/-0.0005 Abs (0.5 to 1 Abs) Tested with NIST SRM 930D |
| Scanning speed | 10~4,000 nm/min (8,000 nm/min in preview mode) |
| Slew speed | UV-Vis: 12,000 nm/min NIR: 48,000 nm/min |
| RMS noise | 0.00003 Abs (0 Abs, wavelength: 500 nm, measurement time: 60 sec, SBW :2 nm) |
| Baseline stability | 0.0003 Abs/hour (Wavelength: 250 nm, response: slow and SBW: 2 nm) |
| Baseline flatness | +/-0.0002 Abs (200 - 2,500 nm) |
| Detector | PMT, Peltier cooled PbS |
| Standard functions | IQ Accessory, Start Button, Analog output |
| Standard programs | Abs/%T meter, Quantitative analysis, Spectrum measurement Time course measurement, Fixed wavelength measurement Validation, Daily check and Dual wavelength time course measurement |
| Dimensions and weight | 460(W) x 602(D) x 268(H) mm, 29 kg |
| Power requirements | 150 VA |
| Installation requirements | Room temperature: 15-30 Celsius, humidity: below 85% |
V-780 UV-Visible Spectrophotometer
| Optical System | Czerny-Turner mount Single monochromator Fully symmetrical double beam type |
| Light Source | Halogen lamp, Deuterium lamp |
| Wavelength range | 190 to 1,600 nm |
| Wavelength accuracy | +/-0.3 nm (at 656.1 nm) +/-1.0 nm (at 1312.2 nm) |
| Wavelength repeatability | +/-0.05 nm (UV-Vis), +/-0.1 nm (NIR) |
| Spectral bandwidth (SBW) | UV-Vis: 0.1, 0.2, 0.5, 1, 2, 5, 10 nm L2, L5, L10 nm (low stray light mode) M1, M2 nm (micro cell mode) NIR: 0.2, 0.4, 0.5, 1, 2, 4, 10, 20, L4, L10, L20 nm (low stray light mode) M2, M4 nm (micro cell mode) |
| Stray light | 1 % (198 nm KCL 12 g/L aqueous solution) 0.005 % (220 nm NaI 10 g/L aqueous solution 0.005 % (340 nm NaNO2 50 g/L aqueous solution) 0.005 % (370 nm NaNO2 50 g/L aqueous solution) SBW: L2nm 0.04 % (1420 nm: H2O) SBW: L4 nm |
| Photometric range | UV-Vis: -4~4 Abs NIR: -3~3 Abs |
| Photometric accuracy | +/-0.0015 Abs (0 to 0.5 Abs) +/-0.0025 Abs (0.5 to 1 Abs) +/-0.3 %T Tested with NIST SRM 930D |
| Photometric repeatability | +/-0.0005 Abs (0 to 0.5 Abs) +/-0.0005 Abs (0.5 to 1 Abs) Tested with NIST SRM 930D |
| Scanning speed | 10~4,000 nm/min (8,000 nm/min in preview mode) |
| Slew speed | UV-Vis: 12000 nm/min NIR: 24000 nm/min |
| RMS noise | 0.00003 Abs (0 Abs, wavelength: 500 nm, measurement time: 60 sec, SBW:2 nm) |
| Baseline stability | 0.0003 Abs/hour 0.04 % (220 nm NaI 10 g/L aqueous solution) 0.02 % (340 nm NaNO2 50 g/L aqueous solution) 0.02 % (370 nm NaNO2 50 g/L aqueous solution) (10 mm cell) |
| Baseline Stability | ±0.0004 Abs/hour (Wavelength: 250 nm, response: slow and SBW: 2nm.) |
| Baseline flatness | +/-0.0002 Abs (200 - 1,600 nm) |
| Detector | Photomultiplier tube, Peltier cooled InGaAs photodiode |
| Standard functions | IQ Accessory, Start Button, Analog output |
| Standard programs | Abs/%T meter, Quantitative analysis, Spectrum measurement, Time course measurement, Fixed wavelength measurement, Validation, Daily Check Two wavelength time course measurement |
| Dimensions and weight | 460(W) x 602(D) x 268(H) mm, 29 kg |
| Power requirements | 150 VA |
| Installation requirements | Room temperature: 15-30 Celsius, humidity: below 85% |