The FT/IR-4X is a powerful Mid-IR FTIR spectrometer, with many features that you find in a research grade instrument, such as non-hygroscopic KRS-5 windows to prevent damage to the interferometer, a temperature controlled DLaTGS detector and a high output ceramic source for maximum sensitivity.
The FT/lR-6X FTIR spectrometers with 28 degree Michelson interferometer and diode timing laser is an excellent choice for more demanding research applications, where better polarization performance or a more flexible approach to samples and measurement are required.
The FT/IR-8X is a highly configurable optical system is applicable to virtually any FTIR application, from simple Mid IR measurement to much more complex analysis in the near and far IR.
The X-Series of FTIR spectrometers provide a complete solution for infrared spectroscopy. For routine chemical identification the FT/IR-4X with 45 degree Michelson interferometer (including permanently aligned corner-cube mirrors, diode laser and AccuTrac™ DSP technology). A single beam-splitter has excellent performance in the mid-IR with DLaTGS detector and non-hygroscopic KRS-5 windows. For higher sensitivity, an MCT detector is a good option for accessories with low light throughput, such as long path-length gas cells. The standard GeKBr beam-splitter can be exchanged with one of several different options to increase the wavenumber range from 15,000 cm-1 in the NIR and to either 220 or 50 cm-1 in the Far-IR.
The FT/IR-6X is a more advance optical system with 28 degree Michelson interferometer (with corner-cube mirrors, diode laser and AccuTrac™ DSP technology), for high resolution measurement a HeNe laser replaces the diode laser. The FT/IR-6X is designed for more challenging measurements such as trace gas analysis, black-body emission or emission characterization, which require higher throughput, and often require several beam-splitters and/or detectors.
The FT/IR-8X is a highly configurable optical system, similar to the FT/IR-6X but can be configured for analyses that require extremely high resolution (down to 0.07 cm-1) or microsecond/nanosecond step-scan measurement.
The entire X-Series takes advantage of many useful software applications in the intuitive Spectra Manager™ Suite with integrated search software solution, KnowItAll® Informatics and database.
FTIR Spectrometers System Features
The interferometer is manufactured as a solid cast aluminum block and is completely sealed. The FT/IR-4X uses a 45 deg Michelson interferometer, while the 6X and 8X use a 28 degree Michelson interferometer. A near frictionless bearing (without the need for a gas supply) supports the moving-mirror which is driven electromagnetically for accurate vibration-free movement. Laser tracking of the moving mirror is made using a diode laser in the 4X and 6X and a HeNe laser in the 8X, coupled with Accutrac™ digital signal processing. The standard solid KRS-5 windows prevent hygroscopic damage often seen with KBr or coated windows used on some products.
High Sensitivity Electrically Cooled DLaTGS Detector
A highly sensitive and stable Peltier cooled DLATGS detector is standard for all instruments.
Diode Timing laser
The temperature controlled VCSEL diode laser offers high resolution spectroscopy with an exceptionally long lifetime. HeNe lasers are used for the highest resolution 0.07 cm-1 and for applications that require visible wavelengths.
IQX Accessory Recognition
Automatic recognition of the sampling accessory is made when it is fitted into the sample compartment. It can also be used to automatically load measurement parameters matched to the accessory; this ensures that data is acquired using the correct parameters.
A sequence of operations, including data processing, can be defined in a sequence in the Spectra Manager measurement application, the sequence can started by the press of the Start button for fast and comprehensive measurement.
For laboratories that operate under the requirement of regulatory compliance, instrument validation routine standard for verification of instrument performance compliant with ASTM, EP, and JP procedures. Spectra Manager CFR is compliant to the latest requirements of ALCOA+
Corner cube mirrors automatically correct for any light path deviation, providing excellent optical stability at all times. Eliminating the need for dynamic alignment, which often lag the detrimental effects of tilt in plane mirrors.
Quick Start Button
The Start Button allows immediate start of sample measurement with a single press - this is a more convenient alternative to keyboard and mouse operation when starting data measurement.
Excellent S/N Ratio
The highly stable interferometer with high-intensity two-stage ceramic light source offers optimum signal-to-noise performance starting at 35,000:1 and up to 55,000:1 (under standardized conditions).
Vibration-Free Optical Bench
Specially designed vibration-proof mounts the optical bench eliminates interference from external vibrations.
Spectra Manager Suite
Spectra Manager 2.5 software allows users to develop predefined methods for custom sampling and analysis applications, executing with a single button press. Data Compare is standard for comparing a measured spectrum with a custom spectral library. Wiley “KnowItAll® Informatics System, JASCO Edition” with a library of 12,000 chemical and polymer spectra is standard (except LE versions) and with 3 month access to the entire spectral library database over over 260,000 IR spectra.
Several Step-Scan options are available for the FT/IR-8X; these include microsecond and nanosecond TRS, phase modulation and amplitude modulation.
Rapid-Scan, is an option on the FT/IR-4X (40Hz) FT/IR-6X, and standard on the FT/IR-8X. Rapid-Scan can be used for fast spectral acquisition using interval analysis.
FTIR Spectrometers Accessories
The IRT-5000/7000 Series infrared microscopes can be easily interfaced to any FT/IR-4X, FT/IR-6X, or FT/IR-8X instrument.
ATR PRO Series
ATR-Pro is fully integrated, but can easily be exchanged with other sampling accessories. The external design is easy to clean with a fully rotatable (360 deg) anvil for full access when placing samples onto the prism.
ATR Pro One X Series
ATR PRO One X
The ATR PRO X is a single-reflection monolithic diamond ATR accessory with a 45° incident angle that can be placed in the sample compartment of the FT/IR-4X -6X or -8X.
ATR PRO One X View
The ATR PRO X VIEW is a single-reflection monolithic diamond ATR accessory with a 45° incident angle that can be placed in the sample compartment of the FT/IR-4X -6X or -8X. The ATR PRO X VIEW has a camera and LCD monitor for real-time sample observation. The observed image and spectrum data are saved together in a single file.
ATR PRO 4X
The ATR PRO 4X is a single-reflection monolithic diamond ATR accessory with a 45° incident angle specifically designed for the FT/IR-4X sample compartment.
ATR PRO 4X View
The ATR PRO 4X VIEW is a single-reflection monolithic diamond ATR accessory with a 45° incident angle specifically designed for the FT/IR-4X sample compartment. The ATR PRO 4X VIEW has a camera and LCD monitor for real-time sample observation. The observed image and spectrum data are saved together in a single file.
Purgeable & Vacuum
The FT/IR-6X and 8X can be fitted with several vacuum options, and can be configured for full vacuum or partial with vacuum interferometer and detector compartments and with the sample chamber nitrogen purged.
All models have fully sealed and desiccated aluminum interferometer chamber. In addition, an integrated purge for the sample compartment (FT/IR-4X) and complete system (FT/IR-6X and FT/IR-8X) is included as standard.
Automatic beam splitter and window exchange allow uninterrupted measurement across the entire spectral range.
Many optional detectors cover the range from 25,000 to 5 cm-1 and include several LN2 cooled pv/pc MCT detectors for wide, narrow and mid-band. Other detectors include silicon photodiode, InGaAs, Si bolometer, etc.