FTIR Spectrometers

The FT/IR-4X is a powerful mid-range, compact FTIR spectrometer, with many features that you find in a research-grade instrument, such as corner-cube mirrors, non-hygroscopic KRS-S windows and a temperature controlled DLaTGS detector.

View The FT/IR-4X
The FT/lR-6X with 28 degree Michelson interferometer is an excellent choice for more demanding research applications, where better polarization performance or a more flexible approach to samples and measurement are required.

View The FT/lR-6X
The FT/IR-8X is a highly configurable optical system, applicable to virtually any FTIR application, from simple Mid IR measurement to much more complex applications, such as step-scan, emission characterization etc.

View The FT/IR-8X

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The X-Series of FTIR Spectrometers

The FT/IR-4X FTIR spectrometer with 45° Michelson interferometer (including permanently aligned corner-cube mirrors, diode laser, and AccuTrac™ DSP technology). A broad range beam-splitter has excellent performance in the mid-IR with DLaTGS detector and non-hygroscopic KRS-5 windows. For higher sensitivity, an MCT detector is a good addition for accessories with low light throughput, such as long path-length gas cells. The standard Ge/KBr beam-splitter can be exchanged with one of several different options to extend the wavenumber range from 15,000 cm^-1 in the NIR to either 220 or 50 cm^-1 in the Far-IR.

The FT/IR-6X FTIR spectrometer includes a more advanced optical system with a 28° Michelson interferometer (also with corner-cube mirrors, diode laser, and AccuTrac™ DSP technology), for high-resolution measurement an optional HeNe laser replaces the diode laser. The FT/IR-6X is designed for more challenging FTIR measurements such as custom sampling accessories with external detector, trace gas analysis, or emission characterization, which require higher throughput, and often require several beam-splitters and/or detectors.

The FT/IR-8X FTIR spectrometer is more advanced and highly configurable, including a HeNe laser and gold-coated optics, operation is similar to the FT/IR-6X but it can also be configured for analyses that require extremely high sensitivity and resolution (down to 0.07 cm^-1) or microsecond/nanosecond step-scan measurement.

The X-Series of FTIR spectrometers takes advantage of many useful software applications in the intuitive Spectra Manager™ Suite with integrated search software solution, KnowItAll^® Informatics, and database.

What Is an FTIR Spectrometer?

A Fourier Transform Infrared (FTIR) spectrometer is an analytical instrument used to quickly identify and characterize materials by measuring how they absorb infrared (IR) light. In simple terms, it shines infrared light through a sample and records which wavelengths are absorbed. Because different chemical bonds absorb IR light in unique ways, the resulting IR spectrum acts like a molecular fingerprint that reveals information about the chemical composition of the sample.

Common Applications Made Simple

FTIR spectrometers are widely used in industry, research, and quality control because they can identify what a material is made of and how much of each component is present. Typical uses include:

Material identification in chemicals, polymers, and pharmaceuticals
Quality control and verification of raw materials
Environmental and forensic analysis
Monitoring chemical changes during reactions
Confirming molecular structure and functional groups

Each application leverages the fact that every unique substance produces a distinct IR absorption pattern.

Key Components:

IR Source
Interferometer
Beam Splitter
Sample Compartment
Detector
Computer/Software for Fourier Transform and analysis

Interferometer

The interferometer is manufactured as a solid cast aluminum block and is hermetically sealed. The FT/IR-4X uses a 45° Michelson interferometer, while the FT/IR-6X/8X use a 28° Michelson interferometer. A near frictionless bearing (without the need for a gas supply) supports the moving mirror which is driven electromagnetically for accurate vibration-free movement. Laser tracking of the moving mirror is made using a diode laser in the FT/IR-4X/6X and a HeNe laser in the FT/IR-8X, coupled with Accutrac™ digital signal processing. The standard solid KRS-5 windows prevent hygroscopic damage often seen with KBr or coated windows used on some products.
High Sensitivity Electrically Cooled DLaTGS Detector

A highly sensitive and stable Peltier cooled DLATGS detector is standard for all instruments.
Diode Timing laser

The temperature controlled VCSEL diode laser offers high resolution spectroscopy with an exceptionally long lifetime. HeNe lasers are used for the highest resolution 0.07 cm^-1 and for applications that require visible wavelengths.

Solutions by Workflow

Configure your X-Series FTIR spectrometer for the way you actually work. From routine QA to advanced research and emissions monitoring, JASCO systems can be tailored with the right model, detector, accessories, and software presets to match your application and user experience level.

QA/QC Laboratories

Fast, repeatable material verification

Best Fit: FT/IR-4X or FT/IR-6X
Common Add-Ons: ATR accessory, DTGS detector, library search + pass/fail presets

Ideal for raw material ID, batch release testing, and regulated workflows that require speed and consistency

Designed for high-throughput, routine operation
Minimal sample preparation
SOP-driven software for compliance

R&D & Failure Analysis

High sensitivity for unknowns and complex samples

Best Fit: FT/IR-6X or FT/IR-8X
Common Add-Ons: FTIR microscope, cooled MCT detector, advanced analysis tools

Ideal for contaminant identification, polymer analysis, micro-sample testing, and materials research.

Higher resolution and sensitivity
Micro-analysis capabilities
Advanced spectral processing

Academic Laboratories

Reliable, easy-to-use systems for instruction

Best Fit: FT/IR-4X
Common Add-Ons: ATR accessory, DTGS detector, educational software presets

Perfect for chemistry labs, materials science programs, and hands-on spectroscopy training.

Simple operation for students
Durable design for frequent use
Pre-configured teaching methods

Environmental & Emissions Monitoring

Accurate gas and VOC analysis

Best Fit: FT/IR-6X or FT/IR-8X
Common Add-Ons: Long-path gas cells, heated gas cells, cooled MCT detector

Built for stack emissions, VOC detection, and environmental compliance testing.

Sensitive low-level detection
Gas-specific quantitative tools
Automated reporting options

Find the Right Configuration

Whether you need a streamlined QA system or a fully configured research platform, JASCO will help you build an FTIR solution tailored to your workflow.

Request a consultation to match your application with the right X-Series configuration.

IQX Accessory Recognition

Automatic recognition of the sampling accessory is made when it is fitted into the sample compartment. It can also be used to automatically load measurement parameters matched to the accessory; this ensures that data is acquired using the correct parameters.
IQ Start

A sequence of operations, including data processing, can be defined in a sequence in the Spectra Manager measurement application, the sequence can started by the press of the Start button for fast and comprehensive measurement.
Regulatory Compliance

For laboratories that operate under the requirement of regulatory compliance, instrument validation routine standard for verification of instrument performance compliant with ASTM, EP, and JP procedures. Spectra Manager CFR is compliant to the latest requirements of ALCOA+

Corner-Cube Mirrors

Corner cube mirrors automatically correct for any light path deviation, providing excellent optical stability at all times. Eliminating the need for dynamic alignment, which often lag the detrimental effects of tilt in plane mirrors.
Quick Start Button

The Start Button allows immediate start of sample measurement with a single press - this is a more convenient alternative to keyboard and mouse operation when starting data measurement.
Excellent S/N Ratio

The highly stable interferometer with high-intensity two-stage ceramic light source offers optimum signal-to-noise performance starting at 35,000:1 and up to 55,000:1 (under standardized conditions).
Vibration-Free Optical Bench

Specially designed vibration-proof mounts the optical bench eliminates interference from external vibrations.
Spectra Manager™ Suite

Spectra Manager™ 2.5 software allows users to develop predefined methods for custom sampling and analysis applications, executing with a single button press. Data Compare is standard for comparing a measured spectrum with a custom spectral library. Wiley “KnowItAll® Informatics System, JASCO Edition” with a library of 12,000 chemical and polymer spectra is standard (except LE versions) and with 3 month access to the entire spectral library database over over 260,000 IR spectra.
Step Scan

Several Step Scan options are available for the FT/IR-8X; these include µsec and nsec Time-Resolved Spectroscopy (TRS), phase modulation, and amplitude modulation.
Rapid Scan

Rapid Scan is an option on the FT/IR-4X (80 Hz) and FT/IR-6X (40 Hz), and standard on the FT/IR-8X (40 Hz). Rapid Scan can be used for fast spectral acquisition using interval analysis.

Microscope/IR Imaging

The IRT-5000/7000 Series infrared microscopes can be easily interfaced to any FT/IR-4X, FT/IR-6X, or FT/IR-8X instrument.

View FTIR Microscopes
ATR PRO Series

The ATR PRO Series is fully integrated, but can easily be exchanged with other sampling accessories. The external design is easy to clean with a fully rotatable (360°) anvil for full access when placing samples onto the prism.

View the ATR Pro Series

ATR PRO One X

The ATR PRO X is a single-reflection monolithic diamond ATR accessory with a 45° incident angle that can be placed in the sample compartment of the FT/IR-4X, FT/IR-6X, or FT/IR-8X.
ATR PRO One X View

The ATR PRO X VIEW is a single-reflection monolithic diamond ATR accessory with a 45° incident angle that can be placed in the sample compartment of the FT/IR-4X, FT/IR-6X, or FT/IR-8X. The ATR PRO X VIEW has a camera and LCD monitor for real-time sample observation. The observed image and spectrum data are saved together in a single file.
ATR PRO 4X

The ATR PRO 4X is a single-reflection monolithic diamond ATR accessory with a 45° incident angle specifically designed for the FT/IR-4X sample compartment.
ATR PRO 4X View

The ATR PRO 4X VIEW is a single-reflection monolithic diamond ATR accessory with a 45° incident angle specifically designed for the FT/IR-4X sample compartment. The ATR PRO 4X VIEW has a camera and LCD monitor for real-time sample observation. The observed image and spectrum data are saved together in a single file.

Purgeable & Vacuum

The FT/IR-6X and FT/IR-8X can be fitted with several vacuum options, and can be configured for full vacuum or partial with vacuum interferometer and detector compartments and with the sample chamber nitrogen purged.

All models have fully sealed and desiccated aluminum interferometer chamber. In addition, an integrated purge for the sample compartment (FT/IR-4X) and complete system (FT/IR-6X and FT/IR-8X) is included as standard.
Beam Splitter

Automatic beam splitter and window exchange allow uninterrupted measurement across the entire spectral range.
Additional Detectors

Many optional detectors cover the range from 25,000 to 5 cm^-1 and include several LN₂ cooled pv/pc MCT detectors for wide, narrow and mid-band. Other detectors include silicon photodiode, InGaAs, Si bolometer, etc.

FAQs

– Which FTIR configurations support rugged industrial or process environments and what performance can be expected?

FT/IR‑6X and FT/IR‑8X can be configured for industrial/process use with purge or vacuum options, long‑path gas cells, and external detectors. With appropriate conditioning, they provide high throughput, rapid scan up to 40–80 Hz, and sub‑ppm sensitivity for multi‑component gas analysis depending on path length and detector.

– What training and method development support are available for new users and QA/QC teams?

JASCO provides onboarding, application-specific method development, and Spectra Manager training, including CFR workflows for regulated labs. Service plans include preventive maintenance, remote support, and validation services (IQ/OQ/PQ).

– Can the systems be configured for bulk gas or trace impurity analysis across multiple channels?

Yes. FT/IR‑6X/8X platforms support multi‑channel gas analysis with automated sampling consoles, long‑path cells, and application methods for bulk gases (e.g., CO, CO₂, H₂O, NO, N₂O). Detection limits and channel counts depend on optical path length, detector choice (e.g., MCT), and sampling configuration.

FTIR Spectrometer - The X-Series

The X-Series of FTIR Spectrometers

What Is an FTIR Spectrometer?

Common Applications Made Simple

Key Components: