The X-Series of FTIR spectrometers provide a complete solution to IR spectroscopy. Each instrument has unique features and specifications that lead to exceptional performance, including a sealed (45 or 28 degree) interferometer with corner-cube mirrors and diode laser (or HeNe) with AccuTrac™ DSP technology.

The X-Series includes the intuitive Spectra Manager™ Suite with integrated search software solution, KnowItAll® Informatics and database.

 

FTIR Spectrometers System Features

  • Interferometer

    The interferometer is manufactured as a solid cast aluminum block and is completely sealed. The FT/IR-4X uses a 45 deg Michelson interferometer, while the 6X and 8X use a 28 degree Michelson interferometer. A near frictionless bearing (without the need for a gas supply) supports the moving-mirror which is driven electromagnetically for accurate vibration-free movement. Laser tracking of the moving mirror is made using a diode laser in the 4X and 6X and a HeNe laser in the 8X, coupled with Accutrac™ digital signal processing. The standard solid KRS-5 windows prevent hygroscopic damage often seen with KBr or coated windows used on some products.

  • High Sensitivity Electrically Cooled DLaTGS Detector

    High Sensitivity Electrically Cooled DLaTGS Detector

    A highly sensitive and stable Peltier cooled DLATGS detector is standard for all instruments.

  • laser

    Diode Timing laser

    The temperature controlled VCSEL diode laser offers high resolution spectroscopy with an exceptionally long lifetime. HeNe lasers are used for the highest resolution 0.07 cm-1 and for applications that require visible wavelengths.

  • IQX Accessory Recognition

    IQX Accessory Recognition

    Automatic recognition of the sampling accessory is made when it is fitted into the sample compartment. It can also be used to automatically load measurement parameters matched to the accessory; this ensures that data is acquired using the correct parameters.

  • quick start

    IQ Start

    A sequence of operations, including data processing, can be defined in a sequence in the Spectra Manager measurement application, the sequence can started by the press of the Start button for fast and comprehensive measurement.

  • audit log

    Regulatory Compliance

    For laboratories that operate under the requirement of regulatory compliance,  instrument validation routine  standard for verification of instrument performance compliant with ASTM, EP, and JP procedures. Spectra Manager CFR is compliant to the latest requirements of ALCOA+

  • Corner-Cube Mirrors

    Corner cube mirrors automatically correct for any light path deviation, providing excellent optical stability at all times. Eliminating the need for dynamic alignment, which often lag the detrimental effects of tilt in plane mirrors.

  • Quick Start Button

    The Start Button on the instrument allows immediate start of sample measurement with a single push of the button. This is a convenient alternative to keyboard and mouse operation when starting data measurement.

  • Excellent S/N Ratio

    The highly stable interferometer with high-intensity two-stage light source offers optimum signal-to-noise performance starting at 35,000:1 and up to 55,000:1 (under standardized conditions).

  • Vibration-Free Optical Bench

    Vibration-Free Optical Bench

    A specially designed vibration-proof mounting of the optical bench completely eliminates interference from external vibrations.

  • spectra manager 2.5

    Spectra Manager Suite

    Spectra Manager 2.5 software allows users to develop predefined methods for their custom sampling and analysis applications, executing them with a single button press. Data Compare is standard for comparing a measured spectrum with a custom spectral library. Wiley “KnowItAll® Informatics System, JASCO Edition” with a library of 12,000 chemical and polymer spectra is standard (except LE versions) and with 3 month access to the entire spectral library database with 260,000 IR spectra.

  • Step Scan

    Step Scan

    Several Step Scan options are available for the FT/IR-8X; these include microsecond and nanosecond TRS, phase modulation and amplitude modulation.

  • rapid scan wide

    Rapid Scan

    Rapid Scan, is an option on the FT/IR-4X (40Hz) FT/IR-6X, and standard on the FT/IR-8X. Rapid Scan can be used for fast spectral acquisition using interval analysis.

FTIR Spectrometers Accessories

  • Microscope/IR Imaging

    The IRT-5000/7000 Series infrared microscopes can be easily interfaced to any FT/IR-4X, FT/IR-6X, or FT/IR-8X instrument.

  • ATR PRO Series

    ATR-Pro is fully integrated, but can easily be exchanged with other sampling accessories. The external design is easy to clean with a fully rotatable (360 deg) anvil for full access when placing samples onto the prism.

  • Purgeable & Vacuum

    The FT/IR-6X and 8X can be fitted with several vacuum options, and can be configured for full vacuum or partial with vacuum interferometer and detector compartments and with the sample chamber nitrogen purged.

    All models have fully sealed and desiccated aluminum interferometer chamber. In addition, an integrated purge for the sample compartment (FT/IR-4X) and complete system (FT/IR-6X and FT/IR-8X) is included as standard.

  • Beam Splitter

    Automatic beam splitter and window exchange allow uninterrupted measurement across the entire spectral range.

  • Additional Detectors

    Many optional detectors cover the range from 25,000 to 5 cm-1 and include several LN2 cooled pv/pc MCT detectors for wide, narrow and mid-band. Other detectors include silicon photodiode, InGaAs, Si bolometer, etc.

Applications

  • Application

    Gas analysis by vacuum FTIR – measurement of low concentration gases

    FTIR-4000 and 6000 Spectrometers A high S/N measurement is often required for the FT-IR analysis of low concentrations of gas or vapor compounds. In addition, the measurement of certain gas samples can be affected by the atmospheric water vapor and carbon dioxide present in the instrument, even with nitrogen purging. It is especially difficult to a...

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  • Application

    Protein secondary structure analysis in low concentration aqueous solutions

    Infrared spectroscopy is an effective technique for component analysis and interaction analysis of biological samples such as proteins, sugars and lipids. FTIR spectroscopy can be used to measure solid and liquid samples when applied to secondary structure analysis of proteins. JASCO has previously reported the study of aqueous protein solutions*1....

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