The X-Series of FTIR Spectrometers

A Comprehensive Range

  • The FT/IR-4X is a powerful Mid-IR FTIR spectrometer, with many features that you find in a research grade instrument, such as non-hygroscopic KRS-5 windows to prevent damage to the interferometer, a temperature controlled DLaTGS detector and a high output ceramic source for maximum sensitivity.

  • The FT/lR-6X FTIR spectrometers with 28 degree Michelson interferometer and diode timing laser is an excellent choice for more demanding research applications, where better polarization performance or a more flexible approach to samples and measurement are required.

  • The FT/IR-8X is a highly configurable optical system is applicable to virtually any FTIR application, from simple Mid IR measurement to much more complex analysis in the near and far IR.

The X-Series of FTIR spectrometers provide a complete solution for infrared spectroscopy. For routine chemical identification the FT/IR-4X with 45 degree Michelson interferometer (including permanently aligned corner-cube mirrors, diode laser and AccuTrac™ DSP technology). A single beam-splitter has excellent performance in the mid-IR with DLaTGS detector and non-hygroscopic KRS-5 windows. For higher sensitivity, an MCT detector is a good option for accessories with low light throughput, such as long path-length gas cells. The standard GeKBr beam-splitter can be exchanged with one of several different options to increase the wavenumber range from 15,000 cm-1 in the NIR and to either 220 or 50 cm-1 in the Far-IR.

The FT/IR-6X is a more advance optical system with 28 degree Michelson interferometer (with corner-cube mirrors, diode laser and AccuTrac™ DSP technology), for high resolution measurement a HeNe laser replaces the diode laser. The FT/IR-6X is designed for more challenging measurements such as trace gas analysis, black-body emission or emission characterization, which require higher throughput, and often require several beam-splitters and/or detectors.

The FT/IR-8X is a highly configurable optical system, similar to the FT/IR-6X but can be configured for analyses that require extremely high resolution (down to 0.07 cm-1) or microsecond/nanosecond step-scan measurement.

The entire X-Series takes advantage of many useful software applications in the intuitive Spectra Manager™ Suite with integrated search software solution, KnowItAll® Informatics and database.