FT/IR-X Series Specifications
| Model | FT/IR-4X | FT/IR-6X | FT/IR-8X |
|---|---|---|---|
| Standard Wavenumber Measurement Range | 7,800 to 350 cm-1 |
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| Optional Extended Wavenumber Range | 11,500 to 375 cm-1, 6,000 to 220 cm-1, 6,000 to 50 cm-1 | 25000 to 20 cm-1 | |
| Maximum Resolution | 0.4 cm-1 | 0.25, 0.5, 1.0, 2, 4, 8, 16 cm-1 | 0.07, 0.25, 0.5, 1.0, 2, 4, 8, 16 cm-1 |
| Sample Chamber | Size: 200 mm (W) × 260 mm (D) × 185 mm Optical path: Center focus, light axis 70 mm high | ||
| Interferometer | 45º Michelson interferometer Corner cube mirror interferometer, with auto-alignment mechanism, sealed structure, DSP control | 28º Michelson interferometer with corner-cube mirror, sealed structure (KRS-5 window, optional window is also available), auto-alignment mechanism, DSP control, alminum mirror coating | |
| N2 Purge | Sample Compartment, Detector (interferometer - option) | Interferometer, sample/detector compartment | |
| Vacuum Instrument | N/A | Sealing | |
| Mirror Coating | Aluminum | Au | |
| Drive Method | Mechanical bearing, electromagnetic drive |
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| Drive Speed | Auto, 1, 2, 3, 4 mm/sec AUTO DLATGS 2.0 mm/sec MCT (optional) 4.0 mm/sec | 0.5, 1, 2, 3, 4, 6, 8 mm/sec. Rapid scan: 32 mm/sec. | 0.125, 0.25, 0.5, 1, 2, 3, 4, 5, 6, 7, 8 mm/sec Rapid scan: 32 mm/sec. |
| Rapid Scan | 80 Hz (optional) | 40 spectra/sec. (16 cm-1 resolution) | 40 spectra/sec. (16 cm-1 resolution) |
| Beam Splitter | Standard: Ge/KBr Option: Si/CaF2, Ge/CsI (not interchangeable) | Ge/KBrOptional: Broad band Quartz, Si/CaF2, Broad band KBr, Broad band mylar, Mid-far IR broad band, (exchangeable, optional automatic beam splitter changer is available) | |
| Light Source | Standard: High-intensity ceramic source Option: Halogen lamp (factory option only) |
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| Detector | DLaTGS (with Peltier temperature control) (standard) | ||
| Optional Detectors | W-MCT, M-MCT, N-MCT, Si, InSb, InGaAs (optional) Up to two detectors can be installed. | MCT-N, MCT-M, MCT-W, MCT-PV, Si photodiode (visible, near IR), InSb, InGaAs, DLATGS (PE window), Broad band DLATGS, Si bolometer, DLATGS (for micro measurement)Up to 2 detectors can be mounted inside the main unit, and the external detector unit should be applied if more than 3 detectors are used (PC switching). There are some limited detectors for mounting inside the main unit, and up to 2 detectors can be mounted to external detector unit. | |
| Signal-to-Noise Ratio: (4 cm-1, 1 min, near 2,200 cm-1) | 35,000:1 | 47000 : 1 | 55000 : 1 |
| Gain Switching | AUTO, 1, 2, 4, 8, 16, 32, 64, 128 | ||
| Communication | USB 2.0 | ||
| Dimensions | 386 (W) × 479 (D) × 254 (H) mm, Weight:18 kg | FT/IR-6X purge model: 600 (W) × 690 (D) × 315 (H) mm, 56 kgFT/IR-6X V Interferometer vacuum model model: 600 (W) × 690 (D) × 315 (H) mm, 58 kg FT/IR-6X FV Full vacuum model: 600 (W) × 700 (D) × 355 (H) mm, 70 kg | FT/IR-8X purge model: 600 (W) × 690 (D) × 315 (H) mm, 56 kgFT/IR-8X V Interferometer vacuum model model: 600 (W) × 690 (D) × 315 (H) mm, 58 kg FT/IR-8X FV Full vacuum model: 600 (W) × 700 (D) × 355 (H) mm, 70 kgPower supply unit: 85 (W) × 260 (D) × 197 (H) mm, 4.7 kg |
Standard Composition
| Item | Quantity | Description |
|---|---|---|
| AC Cable | 1 | AC cable for the power supply |
| USB Cable | 1 | Cable connecting the main unit to the PC |
| Sample Holder | 1 | |
| Standard Sample | 1 | Polystyrene film |
| Stepped Pin | 2 | Used for locating optional accessories in the sample compartment |
| Instruction Manual | 1 | |
| Installation Image | 1 | Spectra Manager™ and KnowItAll® JASCO Edition |
| Fuses | 2 |
FT-Raman Specifications
| Laser (Option) | DPSS laser: 1,064 nm; 1, 2, or 3 W (air-cooled) |
| Rejection Filter | 150 cm-1 or more (Raman shift value) 50 cm-1 or more (Raman shift value ) (Option) |
| Detectors | InGaAs: ~3,600 cm-1 or more (at R.T.) ~3,000 cm-1 or more (77 K) (LN2-cooled) |
| Interferometer | Beam splitter: Si/CaF2 |
| Sample Stage | XYZ stage |
| Beam Collecting System | Lens method: F/0.63 |
| Data Processing Functions | Smoothing, Baseline correction, Peak picking, Sensitivity correction, Arithmetic, Derivatives, Subtract, Raman shift, wavenumber conversion, Data truncate, Overlay, IF conversion, J-CAMP format conversion, Text format conversion |
| Other Standard Components | Laser plasma line rejection filter, Laser power monitor, Light source for Raman intensity correction (Halogen lamp), Interlock mechanism (Laser safety operation), Raman scattering collecting system (uses gold-coated mirrors) |
| Optional Accessories | Liquid sample cell / Liquid sample cell holder/ Powder holder, 90 degree scattering measurement system, TV monitor system for sample observation, Microscopic measurement system (Objective lens: X10, X50 including TV monitor system), Polarization measurement system (1/2 plate, Polarizer), Large XYZ stage, Thermal analysis system, Mapping system, Anti-vibration bench |
Dimensions
Note: laser power supply not shown