FT/IR 4X
Standard Wavenumber Measurement Range
7,800 to 350
cm-1
FT/IR 6X
Standard Wavenumber Measurement Range
7,800 to 350
cm-1
FT/IR 8X
Standard Wavenumber Measurement Range
7,800 to 350
cm-1
Optional Extended Wavenumber Range
11,500 to 375 cm-1, 6,000 to 220 cm-1, 6,000 to 50 cm-1
Optional Extended Wavenumber Range
25000 to 20 cm-1
Optional Extended Wavenumber Range
25000 to 20 cm-1
Maximum Resolution
0.4 cm-1
Maximum Resolution
0.25, 0.5, 1.0, 2, 4, 8, 16 cm-1
Maximum Resolution
0.25, 0.5, 1.0, 2, 4, 8, 16 cm-1
Sample Chamber
Size: 200 mm (W) × 260 mm (D)
× 185 mm
Optical path: Center focus, light axis 70 mm high
Sample Chamber
Size: 200 mm (W) × 260 mm (D)
× 185 mm
Optical path: Center focus, light axis 70 mm high
Sample Chamber
Size: 200 mm (W) × 260 mm (D)
× 185 mm
Optical path: Center focus, light axis 70 mm high
Interferometer
45º Michelson interferometer
Corner cube mirror interferometer, with auto-alignment
mechanism, sealed structure, DSP control
Interferometer
28º Michelson interferometer with corner-cube mirror, sealed structure (KRS-5 window, optional window is also available), auto-alignment mechanism, DSP control, aluminum mirror coating
Interferometer
28º Michelson interferometer with corner-cube mirror, sealed structure (KRS-5 window, optional window is also available), auto-alignment mechanism, DSP control, aluminum mirror coating
N2 Purge
Sample Compartment, Detector (interferometer – option)
N2 Purge
Interferometer, sample/detector compartment
N2 Purge
Interferometer, sample/detector compartment
Vacuum Instrument
N/A
Vacuum Instrument
Sealing
Vacuum Instrument
Sealing
Mirror Coating
Aluminum
Mirror Coating
Aluminum
Mirror Coating
Au
Drive Method
Mechanical bearing,
electromagnetic drive
Drive Method
Mechanical bearing,
electromagnetic drive
Drive Method
Mechanical bearing,
electromagnetic drive
Drive Speed
Auto, 1, 2, 3, 4 mm/sec
AUTO DLATGS 2.0 mm/sec
MCT (optional) 4.0 mm/sec
Drive Speed
0.5, 1, 2, 3, 4, 6, 8 mm/sec.
Rapid scan: 32 mm/sec.
Drive Speed
0.125, 0.25, 0.5, 1, 2, 3, 4, 5, 6, 7, 8 mm/sec
Rapid scan: 32 mm/sec.
Rapid Scan
80 Hz (optional)
Rapid Scan
40 spectra/sec. (16 cm-1 resolution)
Rapid Scan
40 spectra/sec. (16 cm-1 resolution)
Beam Splitter
Standard: Ge/KBr
Option: Si/CaF2, Ge/CsI (not interchangeable)
Beam Splitter
Ge/KBrOptional: Broad band Quartz, Si/CaF2, Broad band KBr, Broad band mylar, Mid-far IR broad band, (exchangeable, optional automatic beam splitter changer is available)
Beam Splitter
Ge/KBrOptional: Broad band Quartz, Si/CaF2, Broad band KBr, Broad band mylar, Mid-far IR broad band, (exchangeable, optional automatic beam splitter changer is available)
Light Source
Standard: High-intensity ceramic source
Option: Halogen lamp (factory option only)
Light Source
Standard: High-intensity ceramic source
Option: Halogen lamp (factory option only)
Light Source
Standard: High-intensity ceramic source
Option: Halogen lamp (factory option only)
Detector
DLaTGS (with Peltier temperature control) (standard)
Detector
DLaTGS (with Peltier temperature control) (standard)
Detector
DLaTGS (with Peltier temperature control) (standard)
Optional Detectors
W-MCT, M-MCT, N-MCT, Si, InSb, InGaAs (optional)
Up to two detectors can be installed.
Optional Detectors
MCT-N, MCT-M, MCT-W, MCT-PV, Si photodiode (visible, near IR), InSb, InGaAs, DLATGS (PE window), Broad band DLATGS, Si bolometer, DLATGS (for micro measurement)Up to 2 detectors can be mounted inside the main unit, and the external detector unit should be applied if more than 3 detectors are used (PC switching). There are some limited detectors for mounting inside the main unit, and up to 2 detectors can be mounted to external detector unit.
Optional Detectors
MCT-N, MCT-M, MCT-W, MCT-PV, Si photodiode (visible, near IR), InSb, InGaAs, DLATGS (PE window), Broad band DLATGS, Si bolometer, DLATGS (for micro measurement)Up to 2 detectors can be mounted inside the main unit, and the external detector unit should be applied if more than 3 detectors are used (PC switching). There are some limited detectors for mounting inside the main unit, and up to 2 detectors can be mounted to external detector unit.
Signal-to-Noise Ratio:
(4 cm-1, 1 min, near 2,200 cm-1)
35,000:1
Signal-to-Noise Ratio:
(4 cm-1, 1 min, near 2,200 cm-1)
47000 : 1
Signal-to-Noise Ratio:
(4 cm-1, 1 min, near 2,200 cm-1)
55000 : 1
Gain Switching
AUTO, 1, 2, 4, 8, 16, 32, 64, 128
Gain Switching
AUTO, 1, 2, 4, 8, 16, 32, 64, 128
Gain Switching
AUTO, 1, 2, 4, 8, 16, 32, 64, 128
Communication
USB 2.0
Communication
USB 2.0
Communication
USB 2.0
Dimensions
386 (W) × 479 (D)
× 254 (H) mm, Weight:18 kg
Dimensions
FT/IR-6X purge model: 600 (W) × 690 (D) × 315 (H) mm, 56 kgFT/IR-6X V
Interferometer vacuum model model: 600 (W) × 690 (D) × 315 (H) mm, 58 kg FT/IR-6X FV
Full vacuum model: 600 (W) × 700 (D) × 355 (H) mm, 70 kg
Dimensions
FT/IR-8X purge model: 600 (W) × 690 (D) × 315 (H) mm, 56 kgFT/IR-8X V
Interferometer vacuum model model: 600 (W) × 690 (D) × 315 (H) mm, 58 kg FT/IR-8X FV
Full vacuum model: 600 (W) × 700 (D) × 355 (H) mm, 70 kgPower supply unit: 85 (W) × 260 (D) × 197 (H) mm, 4.7 kg
Standard Composition
| Item | Quantity | Description |
|---|---|---|
| AC Cable | 1 | AC cable for the power supply |
| USB Cable | 1 | Cable connecting the main unit to the PC |
| Sample Holder | 1 | |
| Standard Sample | 1 | Polystyrene film |
| Stepped Pin | 2 | Used for locating optional accessories in the sample compartment |
| Instruction Manual | 1 | |
| Installation Image | 1 | Spectra Manager™ and KnowItAll® JASCO Edition |
| Fuses | 2 |
FT-Raman Specifications
| Laser (Option) | DPSS laser: 1,064 nm; 1, 2, or 3 W (air-cooled) |
| Rejection Filter | 150 cm-1 or more (Raman shift value) 50 cm-1 or more (Raman shift value ) (Option) |
| Detectors | InGaAs: ~3,600 cm-1 or more (at R.T.) ~3,000 cm-1 or more (77 K) (LN2-cooled) |
| Interferometer | Beam splitter: Si/CaF2 |
| Sample Stage | XYZ stage |
| Beam Collecting System | Lens method: F/0.63 |
| Data Processing Functions | Smoothing, Baseline correction, Peak picking, Sensitivity correction, Arithmetic, Derivatives, Subtract, Raman shift, wavenumber conversion, Data truncate, Overlay, IF conversion, J-CAMP format conversion, Text format conversion |
| Other Standard Components | Laser plasma line rejection filter, Laser power monitor, Light source for Raman intensity correction (Halogen lamp), Interlock mechanism (Laser safety operation), Raman scattering collecting system (uses gold-coated mirrors) |
| Optional Accessories | Liquid sample cell / Liquid sample cell holder/ Powder holder, 90 degree scattering measurement system, TV monitor system for sample observation, Microscopic measurement system (Objective lens: X10, X50 including TV monitor system), Polarization measurement system (1/2 plate, Polarizer), Large XYZ stage, Thermal analysis system, Mapping system, Anti-vibration bench |
Dimensions
Note: laser power supply not shown