FTIR X-Series Specifications

FT/IR-X Series Specifications

Standard Wavenumber Measurement Range7,800 to 350
Optional Extended Wavenumber Range11,500 to 375 cm-1, 6,000 to 220 cm-1, 6,000 to 50 cm-125000 to 20 cm-1
Maximum Resolution0.4 cm-10.25, 0.5, 1.0, 2, 4, 8, 16 cm-10.07, 0.25, 0.5, 1.0, 2, 4, 8, 16 cm-1
Sample ChamberSize: 200 mm (W) × 260 mm (D)
× 185 mm
Optical path: Center focus, light axis 70 mm high
Interferometer45º Michelson interferometer
Corner cube mirror interferometer, with auto-alignment
mechanism, sealed structure, DSP control
28º Michelson interferometer with corner-cube mirror, sealed structure (KRS-5 window, optional window is also available), auto-alignment mechanism, DSP control, alminum mirror coating
N2 PurgeSample Compartment, Detector (interferometer - option)Interferometer, sample/detector compartment
Vacuum InstrumentN/ASealing
Mirror CoatingAluminumAu
Drive MethodMechanical bearing,
electromagnetic drive
Drive SpeedAuto, 1, 2, 3, 4 mm/sec
AUTO DLATGS 2.0 mm/sec
MCT (optional) 4.0 mm/sec
0.5, 1, 2, 3, 4, 6, 8 mm/sec.
Rapid scan: 32 mm/sec.
0.125, 0.25, 0.5, 1, 2, 3, 4, 5, 6, 7, 8 mm/sec
Rapid scan: 32 mm/sec.
Rapid Scan80 Hz (optional)40 spectra/sec. (16 cm-1 resolution)40 spectra/sec. (16 cm-1 resolution)
Beam SplitterStandard: Ge/KBr
Option: Si/CaF2, Ge/CsI (not interchangeable)
Ge/KBrOptional: Broad band Quartz, Si/CaF2, Broad band KBr, Broad band mylar, Mid-far IR broad band, (exchangeable, optional automatic beam splitter changer is available)
Light SourceStandard: High-intensity ceramic source
Option: Halogen lamp (factory option only)
DetectorDLaTGS (with Peltier temperature control) (standard)
Optional DetectorsW-MCT, M-MCT, N-MCT, Si, InSb, InGaAs (optional)
Up to two detectors can be installed.
MCT-N, MCT-M, MCT-W, MCT-PV, Si photodiode (visible, near IR), InSb, InGaAs, DLATGS (PE window), Broad band DLATGS, Si bolometer, DLATGS (for micro measurement)Up to 2 detectors can be mounted inside the main unit, and the external detector unit should be applied if more than 3 detectors are used (PC switching). There are some limited detectors for mounting inside the main unit, and up to 2 detectors can be mounted to external detector unit.
Signal-to-Noise Ratio:
(4 cm-1, 1 min, near 2,200 cm-1)
35,000:147000 : 1 55000 : 1
Gain SwitchingAUTO, 1, 2, 4, 8, 16, 32, 64, 128
CommunicationUSB 2.0
Dimensions 386 (W) × 479 (D)
× 254 (H) mm, Weight:18 kg
FT/IR-6X purge model: 600 (W) × 690 (D) × 315 (H) mm, 56 kgFT/IR-6X V
Interferometer vacuum model model: 600 (W) × 690 (D) × 315 (H) mm, 58 kg FT/IR-6X FV
Full vacuum model: 600 (W) × 700 (D) × 355 (H) mm, 70 kg
FT/IR-8X purge model: 600 (W) × 690 (D) × 315 (H) mm, 56 kgFT/IR-8X V
Interferometer vacuum model model: 600 (W) × 690 (D) × 315 (H) mm, 58 kg FT/IR-8X FV
Full vacuum model: 600 (W) × 700 (D) × 355 (H) mm, 70 kgPower supply unit: 85 (W) × 260 (D) × 197 (H) mm, 4.7 kg

Standard Composition

AC Cable1AC cable for the power supply
USB Cable1Cable connecting the main unit to the PC
Sample Holder1
Standard Sample1Polystyrene film
Stepped Pin2Used for locating optional accessories in the sample compartment
Instruction Manual1
Installation Image1Spectra Manager™ and KnowItAll® JASCO Edition
* LE or LE-CFR Models do not include  KnowItAll® JASCO Edition.

FT-Raman Specifications

Laser (Option)DPSS laser: 1,064 nm; 1, 2, or 3 W (air-cooled)
Rejection Filter150 cm-1 or more (Raman shift value)
50 cm-1 or more (Raman shift value ) (Option)
DetectorsInGaAs: ~3,600 cm-1 or more (at R.T.)
~3,000 cm-1 or more (77 K) (LN2-cooled)
InterferometerBeam splitter: Si/CaF2
Sample StageXYZ stage
Beam Collecting SystemLens method: F/0.63
Data Processing FunctionsSmoothing, Baseline correction, Peak picking, Sensitivity correction, Arithmetic, Derivatives, Subtract, Raman shift, wavenumber conversion, Data truncate, Overlay, IF conversion, J-CAMP format conversion, Text format conversion
Other Standard ComponentsLaser plasma line rejection filter, Laser power monitor, Light source for Raman intensity correction (Halogen lamp), Interlock mechanism (Laser safety operation), Raman scattering collecting system (uses gold-coated mirrors)
Optional AccessoriesLiquid sample cell / Liquid sample cell holder/ Powder holder, 90 degree scattering measurement system, TV monitor system for sample observation, Microscopic measurement system (Objective lens: X10, X50 including TV monitor system), Polarization measurement system (1/2 plate, Polarizer), Large XYZ stage, Thermal analysis system, Mapping system, Anti-vibration bench


Note: laser power supply not shown