FT/IR-4000 Series Specifications
| Model | FT/IR-4600 | FT/IR-4700 |
|---|---|---|
| Standard Wavenumber Measurement Range | 7,800 to 350 cm-1 | |
| Optional Extended Wavenumber Range | 15,000 to 2,200 cm-1, 5,000 to 220 cm-1 | |
| Display Wavenumber Range | 15,000 to 0 cm-1 (standard) | |
| Wavenumber Accuracy | Within ± 0.01 cm-1 (theoretical value) | |
| Maximum Resolution | 0.7 cm-1 | 0.4 cm-1 |
| Optical System | Single beam | |
| Sample Chamber | Size: 200 mm (W) × 260 mm (D) × 185 mm Optical path: Center focus, light axis 70 mm high | |
| Interferometer | 45º Michelson interferometer Corner cube mirror interferometer, with auto-alignment mechanism, sealed structure, DSP control | |
| N2 Purge | Interferometer, Sample Compartment, Detector | |
| Vacuum Instrument | N/A | |
| Mirror Coating | Aluminum | |
| Drive Method | Mechanical bearing, electromagnetic drive | |
| Drive Speed | Auto, 1, 2, 3, 4 mm/sec AUTO DLATGS 2.0 mm/sec MCT (optional) 4.0 mm/sec | |
| Rapid Scan | 10 Hz (optional) | |
| Beam Splitter | Standard: Ge/KBr Option: Si/CaF2, Ge/CsI (not interchangeable) | |
| Replacement Method | N/A | |
| Light Source | Standard: High-intensity ceramic source Option: Halogen lamp (factory option only) | |
| Detector | DLaTGS (with Peltier temperature control) (standard) | |
| Optional Detectors | W-MCT, M-MCT, N-MCT, Si, InSb, InGaAs (optional) Up to two detectors can be mounted internally. | |
| Signal-to-Noise Ratio: (4 cm-1, 1 min, near 2,200 cm-1) | 25,000:1 | 35,000:1 |
| Gain Switching | AUTO, 1, 2, 4, 8, 16, 32, 64, 128 | |
| 100%T Line Flatness | Within 100 ± 1.0%T (4,000 to 700 cm-1, continuous repetitive measurement) | |
| Communication | USB 2.0 | |
| FTIR Main Instrument | Dimensions: 460 (W) × 645 (D) × 290 (H) mm, Weight:33 kg | |
| Power Supply | Dimensions:200 (W) × 285 (D) × 90 (H) mm, Weight:4.7 kg This unit can be placed on its base or on its side. | |
FT/IR-6000 Series Specifications
| Model | FT/IR-6600 | FT/IR-6700 | FT/IR-6800 |
|---|---|---|---|
| Standard Wavenumber Measurement Range | 7,800 to 350 cm-1 | ||
| Optional Extended Wavenumber Range | 25,000 to 10 cm-1 | ||
| Display Wavenumber Range | 15,000 to 0 cm-1 (standard), 25,000 to 0 cm-1 (optional) | ||
| Wavenumber Accuracy | Within ± 0.01 cm-1 (theoretical value) | ||
| Maximum Resolution | 0.4 cm-1 0.07 cm-1 (optional) | 0.25 cm-1 0.07 cm-1 (optional) | 0.07 cm-1 |
| Optical System | Single beam | ||
| Sample Chamber | Size: 200 (W) × 260 (D) × 185 (H) mm Optical path: Center focus, light axis 70 mm high | ||
| Interferometer | 28° Michelson interferometer Corner cube mirror interferometer, with auto-alignment mechanism, sealed structure, DSP control | ||
| N2 Purge | Interferometer, Sample compartment, Detector | ||
| Vacuum Instrument | Full and Partial options | ||
| Mirror Coating | Aluminum | Aluminum | Gold |
| Drive Method | Mechanical bearing, electromagnetic drive | ||
| Drive Speed | 0.5, 1, 2, 3, 4, 5, 6, 7, 8 mm/sec AUTO DLaTGS 2.0 mm/sec. MCT (optional) 4.0 mm/sec. | 0.5, 1, 2, 3, 4, 5, 6, 7, 8 mm/sec AUTO DLATGS 2.0 mm/sec. MCT (optional) 4.0 mm/sec. | 0.125, 0.25, 0.5, 1, 2, 3, 4, 5, 6, 7, 8 mm/sec AUTO DLATGS 2.0 mm/sec. MCT (optional) 4.0 mm/sec. |
| Rapid Scan | 20 Hz (optional) | 20 Hz (standard) | |
| Beam Splitter | Standard: Ge/KBr Option: Quartz, Si/CaF2, Ge/CsI, Mylar (interchangeable) | ||
| Replacement Method | Secure-lock beamsplitter catch system (Option: Automatic beam splitter exchange system) | ||
| Light Source | Standard: High-intensity ceramic source Option: Halogen lamp, water-cooled mercury light source Up to three light sources may be installed simultaneously including external light sources | ||
| Detector | DLaTGS (with Peltier temperature control) (standard) | ||
| Optional Detectors | W-MCT, M-MCT, N-MCT, Si, InSb, InGaAs, PAS, Si bolometer (optional) Two detectors may be mounted simultaneously within the instrument. Up to two external detectors may be installed. | ||
| Signal-to-Noise Ratio: (4 cm-1, 1 min, near 2,200 cm-1) | 45,000:1 | 47,000:1 | 55,000:1 |
| Gain Switching | AUTO, 1, 2, 4, 8, 16, 32, 64, 128 | ||
| 100%T Line Flatness | Within 100 ± 1.0%T (4,000 to 700 cm-1, continuous repetitive measurement) | ||
| Communication | USB 2.0 | ||
| FTIR Main Instrument | Dimensions: 600 (W) × 670 (D) × 315 (H) mm Weight:56 kg | ||
| Power Supply | Dimensions: 200 (W) × 285 (D) × 90 (H) mm Weight: 4.7 kg Unit can be placed on its base or on its side | ||
Standard Composition
| Item | Quantity | Description |
|---|---|---|
| Power Supply | 1 | |
| Connection Cable | 1 | Cable for connecting the main unit to the power supply |
| AC Cable | 1 | AC cable for the power supply |
| USB Cable | 1 | Cable connecting the main unit to the PC |
| Sample Holder | 1 | |
| Standard Sample | 1 | Polystyrene film |
| Stepped Pin | 2 | Used for locating optional accessories in the sample compartment |
| Instruction Manual | 1 | |
| Installation CD | 1 | Including Spectra Manager™, QAU-4000 Quantitative program and KnowItAll® JASCO Edition |
| Fuses | 2 |
* CFR Model does not include QAU-4000.
* LE or LE-CFR Models do not include QAU-4000 and KnowItAll® JASCO Edition.
FT-Raman Specifications
| Laser (Option) | YAG laser: 1,064 nm; 1, 2, or 3 W (air-cooled) |
| Rejection Filter | 150 cm-1 or more (Raman shift value) 50 cm-1 or more (Raman shift value ) (Option) |
| Detectors | InGaAs: ~3,600 cm-1 or more (at R.T.) ~3,000 cm-1 or more (77 K) (LN2-cooled) |
| Interferometer | Beam splitter: Si/CaF2 |
| Sample Stage | XYZ stage |
| Beam Collecting System | Lens method: F/0.63 |
| Data Processing Functions | Smoothing, Baseline correction, Peak picking, Sensitivity correction, Arithmetic, Derivatives, Subtract, Raman shift, wavenumber conversion, Data truncate, Overlay, IF conversion, J-CAMP format conversion, Text format conversion |
| Other Standard Components | Laser plasma line rejection filter, Laser power monitor, Light source for Raman intensity correction (Halogen lamp), Interlock mechanism (Laser safety operation), Raman scattering collecting system (uses gold-coated mirrors) |
| Optional Accessories | Liquid sample cell / Liquid sample cell holder/ Powder holder, 90 degree scattering measurement system, TV monitor system for sample observation, Microscopic measurement system (Objective lens: X10, X50 including TV monitor system), Polarization measurement system (1/2 plate, Polarizer), Large XYZ stage, Thermal analysis system, Mapping system, Anti-vibration bench |
Dimensions
Note: Excluding laser power supply