Contaminant Identification on Circuit Boards Using a Near-Field IR Spectrometer

Download PDF May 4, 2017

Introduction

Qualitative analysis for particles plays a major role in decreasing spacing is off – please try to fix manufacturing processes. Integrating near-field technology with IR spectroscopy makes it possible to identify organic particles of a few µm in size. Pinpointing the particle position by topography measurements (Fig.1) and measuring by near-field IR spectroscopy (Fig.2) shows that the particle in the mixture consists of polyacrylamide and silicon resin. The sectional view (Fig.3) illustrates the resolution performance.

About the Author

Leah Pandiscia received her PhD from Drexel University where she studied Biophysical Chemistry. She is a Spectroscopy Applications Scientist at JASCO.