On-line Monitoring of an Amorphous Silicon Layer on a Solar Cell
August 23, 2022
Introduction
On-line monitoring is often used to observe a process to ensure quality on a constant basis. The MV-2000 Series UV-visible PDA spectrophotometer offers excellent performance for a variety of applications and is highly configurable for a wide range of sample analyses. With the ability to perform transmission or reflection measurements, the MV-2000 Series can be used to make in-situ or on-line measurements for applications such as the monitoring chemical reactions or physical vapor deposition, manufacturing and polishing processes, and film thickness measurement.
Applications
- In-situ or on-line process monitoring
- Physical or Chemical Vapor Deposition
- Chemical/Mechanical Polishing
- Chemical Crystallization
- Final product inspection
- Optical materials Research & Development
Example of On-line Monitoring of an Amorphous Silicon Layer on a Solar Cell
Keywords
UV-visible diode array UV-visible spectrophotometer, process monitoring, fiber probe
Featured Products:
-
Film Holders for UV-Visible/NIR Spectrophotometers
-
A high sensitivity UV-Visible/NIR Spectrophotometer with InGaAs detector for wavelengths up to1600nm
V-780 UV-Visible/NIR Spectrophotometer
-
A high resolution UV-Visible double-beam spectrophotometer with single monochromator, variable SBW and PMT detector
V-750 UV-Visible Spectrophotometer
On-line Monitoring of an Amorphous Silicon Layer on a Solar Cell
Introduction
On-line monitoring is often used to observe a process to ensure quality on a constant basis. The MV-2000 Series UV-visible PDA spectrophotometer offers excellent performance for a variety of applications and is highly configurable for a wide range of sample analyses. With the ability to perform transmission or reflection measurements, the MV-2000 Series can be used to make in-situ or on-line measurements for applications such as the monitoring chemical reactions or physical vapor deposition, manufacturing and polishing processes, and film thickness measurement.
Applications
- In-situ or on-line process monitoring
- Physical or Chemical Vapor Deposition
- Chemical/Mechanical Polishing
- Chemical Crystallization
- Final product inspection
- Optical materials Research & Development
Example of On-line Monitoring of an Amorphous Silicon Layer on a Solar Cell
Keywords
UV-visible diode array UV-visible spectrophotometer, process monitoring, fiber probe