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Home / Applications / On-line Monitoring of an Amorphous Silicon Layer on a Solar Cell

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  • Technique

On-line Monitoring of an Amorphous Silicon Layer on a Solar Cell

By Heather Haffner

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August 23, 2022

Introduction

MV-2000 PDA UV-visible spectrophotmeter
JASCO MV-2000 Portable Multi-channel UV-visible Spectrophotometer

On-line monitoring is often used to observe a process to ensure quality on a constant basis. The MV-2000 Series UV-visible PDA spectrophotometer offers excellent performance for a variety of applications and is highly configurable for a wide range of sample analyses. With the ability to perform transmission or reflection measurements, the MV-2000 Series can be used to make in-situ or on-line measurements for applications such as the monitoring chemical reactions or physical vapor deposition, manufacturing and polishing processes, and film thickness measurement.

Applications

  • In-situ or on-line process monitoring
  • Physical or Chemical Vapor Deposition
  • Chemical/Mechanical Polishing
  • Chemical Crystallization
  • Final product inspection
  • Optical materials Research & Development

Example of On-line Monitoring of an Amorphous Silicon Layer on a Solar Cell

Keywords

UV-visible diode array UV-visible spectrophotometer, process monitoring, fiber probe

This document has been prepared based on information available at the time of publication and is subject to revision without notice. Although the contents are checked with the utmost care, we do not guarantee their accuracy or completeness. JASCO Corporation assumes no responsibility or liability for any loss or damage incurred as a result of the use of any information contained in this document. Copyright and other intellectual property rights in this document remain the property of JASCO Corporation. Please do not attempt to copy, modify, redistribute, or sell etc. in whole or in part without prior written permission.

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About the Author

JASCO Application Note

On-line Monitoring of an Amorphous Silicon Layer on a Solar Cell

Introduction

MV-2000 PDA UV-visible spectrophotmeter
JASCO MV-2000 Portable Multi-channel UV-visible Spectrophotometer

On-line monitoring is often used to observe a process to ensure quality on a constant basis. The MV-2000 Series UV-visible PDA spectrophotometer offers excellent performance for a variety of applications and is highly configurable for a wide range of sample analyses. With the ability to perform transmission or reflection measurements, the MV-2000 Series can be used to make in-situ or on-line measurements for applications such as the monitoring chemical reactions or physical vapor deposition, manufacturing and polishing processes, and film thickness measurement.

Applications

  • In-situ or on-line process monitoring
  • Physical or Chemical Vapor Deposition
  • Chemical/Mechanical Polishing
  • Chemical Crystallization
  • Final product inspection
  • Optical materials Research & Development

Example of On-line Monitoring of an Amorphous Silicon Layer on a Solar Cell

Keywords

UV-visible diode array UV-visible spectrophotometer, process monitoring, fiber probe

This document has been prepared based on information available at the time of publication and is subject to revision without notice. Although the contents are checked with the utmost care, we do not guarantee their accuracy or completeness. JASCO Corporation assumes no responsibility or liability for any loss or damage incurred as a result of the use of any information contained in this document. Copyright and other intellectual property rights in this document remain the property of JASCO Corporation. Please do not attempt to copy, modify, redistribute, or sell etc. in whole or in part without prior written permission.
28600 Mary’s Court, Easton, MD 21601 USA • (800) 333-5272 • Fax: (410) 822-7526 • jascoinc.com/applications

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