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Home / Applications / Vacuum FTIR with Long Path Length Cell for the Analysis of Low Concentration Gases

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Vacuum FTIR with Long Path Length Cell for the Analysis of Low Concentration Gases

By Kenichi Akao

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May 2, 2024

Introduction

A high S/N measurement is generally required for FTIR analysis of low concentrations of gas or vapor compounds. However the measurement of some gases can be difficult due to the presence of atmospheric water vapor and carbon dioxide present in the optical path of the instrument, even with nitrogen purging. It is especially difficult to analyze NO because the absorption band is in the same spectral region as water vapor, it is also difficult to measure NO2, CO2 and CO gases, whose absorption bands are in the same region asCO2 absorption. Using a full-vacuum spectrometer, water vapor and carbon dioxide in the light path can be completely eliminated and the measurement can be made at much lower concentrations.

Figure 1 Spectrum of a 2 ppm CO sample in a 20 m gas cell, with a S/N approx. 200:1. Figure 2 The noise level of a spectrum measured with the same conditions is ~4 x 10-5 Abs. At this noise level, measurement of CO gas can be easily made with concentrations as low as 20-50 ppb.

Experimental

Figure 1 Spectrum of a 2 ppm CO sample in a 20 m gas cell, with a S/N approx. 200:1. Figure 2 The noise level of a spectrum measured with the same conditions is ~4 x 10-5 Abs. At this noise level, measurement of CO gas can be easily made with concentrations as low as 20-50 ppb.

Keywords

230-TR-0165, NO2, CO2, CO, Gas analysis, Vacuum FTIR, long path gas cell, carbon monoxide, nitrogen dioxide, nitric oxide carbon dioxide

This document has been prepared based on information available at the time of publication and is subject to revision without notice. Although the contents are checked with the utmost care, we do not guarantee their accuracy or completeness. JASCO Corporation assumes no responsibility or liability for any loss or damage incurred as a result of the use of any information contained in this document. Copyright and other intellectual property rights in this document remain the property of JASCO Corporation. Please do not attempt to copy, modify, redistribute, or sell etc. in whole or in part without prior written permission.

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About the Author

Mr. Akao, is the Applications Group Manager at JASCO Corporation, with many years at the company working on applications in electronic and vibrational spectroscopy, and is an expert in IR and Raman spectroscopy.

JASCO Application Note

Vacuum FTIR with Long Path Length Cell for the Analysis of Low Concentration Gases

Introduction

A high S/N measurement is generally required for FTIR analysis of low concentrations of gas or vapor compounds. However the measurement of some gases can be difficult due to the presence of atmospheric water vapor and carbon dioxide present in the optical path of the instrument, even with nitrogen purging. It is especially difficult to analyze NO because the absorption band is in the same spectral region as water vapor, it is also difficult to measure NO2, CO2 and CO gases, whose absorption bands are in the same region asCO2 absorption. Using a full-vacuum spectrometer, water vapor and carbon dioxide in the light path can be completely eliminated and the measurement can be made at much lower concentrations.

Figure 1 Spectrum of a 2 ppm CO sample in a 20 m gas cell, with a S/N approx. 200:1. Figure 2 The noise level of a spectrum measured with the same conditions is ~4 x 10-5 Abs. At this noise level, measurement of CO gas can be easily made with concentrations as low as 20-50 ppb.

Experimental

Figure 1 Spectrum of a 2 ppm CO sample in a 20 m gas cell, with a S/N approx. 200:1. Figure 2 The noise level of a spectrum measured with the same conditions is ~4 x 10-5 Abs. At this noise level, measurement of CO gas can be easily made with concentrations as low as 20-50 ppb.

Keywords

230-TR-0165, NO2, CO2, CO, Gas analysis, Vacuum FTIR, long path gas cell, carbon monoxide, nitrogen dioxide, nitric oxide carbon dioxide

This document has been prepared based on information available at the time of publication and is subject to revision without notice. Although the contents are checked with the utmost care, we do not guarantee their accuracy or completeness. JASCO Corporation assumes no responsibility or liability for any loss or damage incurred as a result of the use of any information contained in this document. Copyright and other intellectual property rights in this document remain the property of JASCO Corporation. Please do not attempt to copy, modify, redistribute, or sell etc. in whole or in part without prior written permission.
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