The MSV-300 series is a microspectroscopy system providing transmittance and reflectance measurements of microscopic sample sites for a wide range of wavelengths from the ultraviolet to the near infrared. Conventional measurements require samples with dimensions comparable to a millimeter-sized optical beam. The MSV-300 series can provide measurements of the color, film thickness, and other spectral properties of a microscopic area for either large or small samples. The optional, automated X-Y-Z stage provides multi-point measurements and surface analysis mapping capabilities.
- Optical property of crystals
- Band-gap measurement and film thickness
- Characteristics of micro filters and mirrors