Applications
ReferenceYearTechnique Title
Semiconductor Stress Measurement
220-AT-0222
2011
FTIR Analysis of Si Wafer Surface Using a 65-Degree Incident Angle ATR
100-AT-0227B
2011
Measurement of Oriented Films and Liquid Crystal Molecules by a Polarized ATR Accessory
140-AT-0221
2010
Terahertz ATR Measurement of Liquids by Vacuum FTIR
220-TR-0164
~1999