Material Analysis Archives - Page 4 of 6 - JASCO

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ReferenceYearTechnique Title

100-SO-0238

2014

FTIR, FTIR Microscopy

MCR Chemometric Modeling for FTIR Imaging Microscopy

210-UV-0024

2012

UV-Visible/NIR, UV-Visible/NIR Microscopy

Transmission Measurement of Volvox Algae using a MSV-5000 Series UV-Visible Microscope

190-UV-0022

2012

UV-Visible/NIR, UV-Visible/NIR Microscopy

Estimation of the Refractive Index of a Monocrystalline Sapphire via Polarization Measurement using the MSV-5000 Series Microscopic Spectrophotometer

220-UV-0021

2012

Film Thickness, UV-Visible/NIR, UV-Visible/NIR Microscopy

Thickness Analysis of Natural Oxide Films using a MSV-5000 Microscopic Spectrophotometer

The Analysis of Polymer Additives using Supercritical Fluid Chromatography

FTIR, FTIR Microscopy

Advanced FTIR Imaging System with Linear Array MCT Detector

Electric Field Modulation Spectrophotometer

Evaluation of Organic Electro-luminescent (EL) Materials

FTIR, Portable FTIR

Field-Rugged FTIR Microscope for On-Site Analysis

Multi-Layer Film Analysis by Ellipsometry

Film Thickness, FT-NIR, FTIR

Automated Measurement of the Film Thickness of Epitaxial Layers on Semi-Conductor Wafers using IR or NIR Analysis

Thickness distribution of thin films by ellipsometry

Raman Analysis of Injection Molding -measurement of the polymer state during a process

On-Line FTIR monitoring with a field-rugged spectrometer with fiber-optic cable

Field-rugged FTIR for in-situ monitoring of chemical vapor deposition (CVD)

Color Analysis of Fluorescence Materials for FPD

Monitoring of Polysilicon Crystallization Using a Laser

UV-Visible Diode-Array Spectrophotometer for In-Line Monitoring for QC

On-line Monitoring of an Amorphous Silicon Layer on a Solar Cell

Contaminant Identification on Circuit Boards Using a Near-Field IR Spectrometer

Using a 785nm laser to reduce fluorescence in Raman analysis of a contaminant in a film