Material Analysis Archives - Page 5 of 5 - JASCO

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Technique Title

Single-Layer Carbon Nanotube

Evaluation of Carbon Materials

Evaluation of Diamond Like Carbon (DLC)

Semiconductor Stress Measurement

FTIR Analysis of Si Wafer Surface Using a 65-Degree Incident Angle ATR

Measurement of Oriented Films and Liquid Crystal Molecules by a Polarized ATR Accessory

Terahertz ATR Measurement of Liquids by Vacuum FTIR

Analysis of silicon wafers by vacuum FTIR

Nanospectroscopy using a Near-Field Scanning Microspectrometer