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Home / Applications / Using a 785nm laser to reduce fluorescence in Raman analysis of a contaminant in a film

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Using a 785nm laser to reduce fluorescence in Raman analysis of a contaminant in a film

By Heather Haffner

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August 23, 2022

Introduction

NRS-3000 Series
NRS-3000 Series

Fluorescence is an undesirable side-effect found in Raman measurement and various techniques have been developed to eliminate it or minimize its effects. One practical and effective technique is to use a longer wavelength laser that does not induce fluorescence. Recently, demand has been increasing for impurity analysis at micron resolution, which cannot be performed using infrared light. The NRS-3000 series offers measurement of samples which may fluorescence with greater sensitivity by using a 785 nm solid-state laser and optimizing optical elements, such as the beam splitter, for the near-infrared region. The figure below shows an example of measurement using an excitation at 785 nm for a sample with fluorescence. The strong background observed with a green laser obscures the Raman signal, whereas using 785 nm the excitation is outside of the fluorescence range, which allows the measurement of a good Raman spectrum.

This document has been prepared based on information available at the time of publication and is subject to revision without notice. Although the contents are checked with the utmost care, we do not guarantee their accuracy or completeness. JASCO Corporation assumes no responsibility or liability for any loss or damage incurred as a result of the use of any information contained in this document. Copyright and other intellectual property rights in this document remain the property of JASCO Corporation. Please do not attempt to copy, modify, redistribute, or sell etc. in whole or in part without prior written permission.

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About the Author

JASCO Application Note

Using a 785nm laser to reduce fluorescence in Raman analysis of a contaminant in a film

Introduction

NRS-3000 Series
NRS-3000 Series

Fluorescence is an undesirable side-effect found in Raman measurement and various techniques have been developed to eliminate it or minimize its effects. One practical and effective technique is to use a longer wavelength laser that does not induce fluorescence. Recently, demand has been increasing for impurity analysis at micron resolution, which cannot be performed using infrared light. The NRS-3000 series offers measurement of samples which may fluorescence with greater sensitivity by using a 785 nm solid-state laser and optimizing optical elements, such as the beam splitter, for the near-infrared region. The figure below shows an example of measurement using an excitation at 785 nm for a sample with fluorescence. The strong background observed with a green laser obscures the Raman signal, whereas using 785 nm the excitation is outside of the fluorescence range, which allows the measurement of a good Raman spectrum.

This document has been prepared based on information available at the time of publication and is subject to revision without notice. Although the contents are checked with the utmost care, we do not guarantee their accuracy or completeness. JASCO Corporation assumes no responsibility or liability for any loss or damage incurred as a result of the use of any information contained in this document. Copyright and other intellectual property rights in this document remain the property of JASCO Corporation. Please do not attempt to copy, modify, redistribute, or sell etc. in whole or in part without prior written permission.
28600 Mary’s Court, Easton, MD 21601 USA • (800) 333-5272 • Fax: (410) 822-7526 • jascoinc.com/applications

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