Measurement of the Transition Process of a Semiconductor

Download PDF May 4, 2017

Introduction

Jasco NFS 300
Jasco NFS 200/300 Series

Emission or absorption time course measurements enable us to observe excitation electrons or energy dynamics and to understand how the place of observation or the environment influences the semiconductor transitions. Figure 1 illustrates the emission spectrum of a semiconductor substrate InP. Two peaks appear and they demonstrate the differences in the transition process from the excitation state to the ground state. Figure 2 demonstrates the data from a time resolved measurement of the two peaks. The attenuation time of the peak of the lower energy side (longer wavelength) was longer than that of the higher energy side (shorter wavelength). Most likely, the peak due to the lower wavelength was trapped by a donor receptor during the transition process.

Fig.1 Emission spectrum of a semiconductor substrate InP
Fig. 2 Time-resolved measurement of the two transition peaks

About the Author

Leah Pandiscia received her PhD from Drexel University where she studied Biophysical Chemistry. She is a Spectroscopy Applications Scientist at JASCO.