Measurement of the Transition Process of a Semiconductor

August 23, 2022

Introduction

Jasco NFS 300
Jasco NFS 200/300 Series

Emission or absorption time course measurements enable us to observe excitation electrons or energy dynamics and to understand how the place of observation or the environment influences the semiconductor transitions. Figure 1 illustrates the emission spectrum of a semiconductor substrate InP. Two peaks appear and they demonstrate the differences in the transition process from the excitation state to the ground state. Figure 2 demonstrates the data from a time resolved measurement of the two peaks. The attenuation time of the peak of the lower energy side (longer wavelength) was longer than that of the higher energy side (shorter wavelength). Most likely, the peak due to the lower wavelength was trapped by a donor receptor during the transition process.

Fig.1 Emission spectrum of a semiconductor substrate InP
Fig. 2 Time-resolved measurement of the two transition peaks
This document has been prepared based on information available at the time of publication and is subject to revision without notice. Although the contents are checked with the utmost care, we do not guarantee their accuracy or completeness. JASCO Corporation assumes no responsibility or liability for any loss or damage incurred as a result of the use of any information contained in this document. Copyright and other intellectual property rights in this document remain the property of JASCO Corporation. Please do not attempt to copy, modify, redistribute, or sell etc. in whole or in part without prior written permission.

Featured Products:

About the Author