260-PR-0231 2012 Film Thickness, FTIR Measurement of Thin Films by Polarization-Modulation Infrared Reflection-Absorption Spectroscopy (PM-IRRAS) Measurement of Thin Films by Polarization-Modulation Infrared Reflection-Absorption Spectroscopy (PM-IRRAS) Keisuke Watanabe May 2, 2024
220-UV-0021 2012 Film Thickness, UV-Visible/NIR, UV-Visible/NIR Microscopy Thickness Analysis of Natural Oxide Films using a MSV-5000 Microscopic Spectrophotometer Thickness Analysis of Natural Oxide Films using a MSV-5000 Microscopic Spectrophotometer Leah Pandiscia, PhD January 5, 2024
Film Thickness, FT-NIR, FTIR Automated Measurement of the Film Thickness of Epitaxial Layers on Semi-Conductor Wafers using IR or NIR Analysis Automated Measurement of the Film Thickness of Epitaxial Layers on Semi-Conductor Wafers using IR or NIR Analysis Miyuki Kanno June 13, 2024