Film Thickness Archives - Page 4 of 5 - JASCO

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ReferenceYearTechnique Title

220-UV-0021

2012

Film Thickness, UV-Visible/NIR, UV-Visible/NIR Microscopy

Thickness Analysis of Natural Oxide Films using a MSV-5000 Microscopic Spectrophotometer

FTIR, FTIR Microscopy

Advanced FTIR Imaging System with Linear Array MCT Detector

FTIR, FTIR Microscopy

FTIR Dynamic Imaging for the Analysis of Chemical Reactions

Analysis of Automotive Polymers using FTIR with ATR Sample Measurement

Purification of Carvone in Spearmint Oil using SFC with Dual-Monitoring PDA and FTIR

FTIR, Portable FTIR

Field-Rugged FTIR Microscope for On-Site Analysis

Film Thickness, FT-NIR, FTIR

Automated Measurement of the Film Thickness of Epitaxial Layers on Semi-Conductor Wafers using IR or NIR Analysis

Raman Analysis of Injection Molding -measurement of the polymer state during a process

On-Line FTIR monitoring with a field-rugged spectrometer with fiber-optic cable

Field-rugged FTIR for in-situ monitoring of chemical vapor deposition (CVD)

Using a 785nm laser to reduce fluorescence in Raman analysis of a contaminant in a film

Confocal Raman imaging microscopy for non-destructive analysis of impurities in polymers

FTIR, FTIR Microscopy

FTIR Linear Array Microscope for Qualitative Analysis of Semiconductor Contaminants

FTIR, FTIR Microscopy

Contaminant analysis using FTIR microscopy

Raman for the evaluation of carrier concentrations in GaN

Evaluation of Polysilicon

Single-Layer Carbon Nanotube

Evaluation of Carbon Materials

Evaluation of Diamond Like Carbon (DLC)

Semiconductor Stress Measurement