Film Thickness, FTIR Measurement of Thin Films by Polarization-Modulation Infrared Reflection-Absorption Spectroscopy (PM-IRRAS) Measurement of Thin Films by Polarization-Modulation Infrared Reflection-Absorption Spectroscopy (PM-IRRAS) Keisuke Watanabe April 20, 2023
Film Thickness, UV-Visible/NIR, UV-Visible/NIR Microscopy Thickness Analysis of Natural Oxide Films using a MSV-5000 Microscopic Spectrophotometer Thickness Analysis of Natural Oxide Films using a MSV-5000 Microscopic Spectrophotometer Leah Pandiscia, PhD August 18, 2022
Film Thickness, FTIR Automated Semi-Conductor Wafer Analysis in the IR or NIR Region for Film-Thickness Automated Semi-Conductor Wafer Analysis in the IR or NIR Region for Film-Thickness Miyuki Kanno August 22, 2022
