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Home / Applications / Transmittance Near-field measurements in the UV-visible/NIR range at 0.1 to 1 µm spatial resolution

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Transmittance Near-field measurements in the UV-visible/NIR range at 0.1 to 1 µm spatial resolution

By Leah Pandiscia, PhD

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August 23, 2022

Introduction

Jasco NFS 300
Jasco NFS 300

Photoluminescence (PL) and electroluminescence (EL) measurements are standard techniques for evaluation of the crystallinity, functionality and luminescent mechanism of semiconductors. For these samples, near-field optical microscopy is the only effective method for characterization of the composition and distribution of luminescent centers on the nanometer scale.

In combination with a superconductive magnetic field, luminescent spectral measurements of the sample surface can be accomplished with nano-scale spatial resolution while applying temperatures as low as 7K and magnetic fields as high as 4 Tesla.

Luminescent Measurement of InGaN by NFS Series Scanning Near-Field Optical Microspectrometer

This document has been prepared based on information available at the time of publication and is subject to revision without notice. Although the contents are checked with the utmost care, we do not guarantee their accuracy or completeness. JASCO Corporation assumes no responsibility or liability for any loss or damage incurred as a result of the use of any information contained in this document. Copyright and other intellectual property rights in this document remain the property of JASCO Corporation. Please do not attempt to copy, modify, redistribute, or sell etc. in whole or in part without prior written permission.

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About the Author

Leah Pandiscia received her PhD from Drexel University where she studied Biophysical Chemistry. She is a Spectroscopy Applications Scientist.

JASCO Application Note

Transmittance Near-field measurements in the UV-visible/NIR range at 0.1 to 1 µm spatial resolution

Introduction

Jasco NFS 300
Jasco NFS 300

Photoluminescence (PL) and electroluminescence (EL) measurements are standard techniques for evaluation of the crystallinity, functionality and luminescent mechanism of semiconductors. For these samples, near-field optical microscopy is the only effective method for characterization of the composition and distribution of luminescent centers on the nanometer scale.

In combination with a superconductive magnetic field, luminescent spectral measurements of the sample surface can be accomplished with nano-scale spatial resolution while applying temperatures as low as 7K and magnetic fields as high as 4 Tesla.

Luminescent Measurement of InGaN by NFS Series Scanning Near-Field Optical Microspectrometer

This document has been prepared based on information available at the time of publication and is subject to revision without notice. Although the contents are checked with the utmost care, we do not guarantee their accuracy or completeness. JASCO Corporation assumes no responsibility or liability for any loss or damage incurred as a result of the use of any information contained in this document. Copyright and other intellectual property rights in this document remain the property of JASCO Corporation. Please do not attempt to copy, modify, redistribute, or sell etc. in whole or in part without prior written permission.
28600 Mary’s Court, Easton, MD 21601 USA • (800) 333-5272 • Fax: (410) 822-7526 • jascoinc.com/applications

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