Scanning Near-Field Optical Microspectrometer

The NFS Series of scanning near-field optical microspectrometers have been optimized as a new solution for nanotechnology applications. Traditionally, characterization methods on the nanometer scale consist of topography observation using an electron or scanning probe microscope or elemental analysis using an x-ray microanalyzer. These methods deliver images with high spatial resolution, but cannot obtain chemical information from a sample surface.

Near Field ScanningFTIR, photoluminescence, or Raman microspectroscopy instruments can provide chemical data for a sample, but the spatial resolution is determined by the diffraction limit of light, limited to the wavelength of the light used. Scanning near-field microspectrometers allows characterization at the extreme nano level range exceeding the diffraction limit of light.

Introducing light into a fiber probe with an aperture of a hundred to several hundred nm produces near-field light of the same size as the probe aperture. Bringing the sample close to the probe aperture (within 100 nm) allows spectroscopic observations with a spatial resolution of several hundred nm as a result of the interaction of the near-field light with the sample surface.

Near Field Scanning Chart