Specular Reflectance Accessory
The SLM-907 specular reflectance accessory measures the relative reflectance of a sample in comparison with the light reflected from an aluminum-deposited reference plane mirror. It is typically used for the reflectance measurement of sample types such as: metal-deposited films, metal plating, and other thin films. Film thickness can be calculated using the film thickness analysis program in Spectra Manager.
Specifications
| Wavelength Range | 250 to 1000 nm (V-730 UV-visible) 200 to 900 nm (V-750/760 UV-visible) 200 to 2700 nm (V-770 UV-visible/NIR) 200 to 1600 nm (V-780 UV-visible/NIR) |
| Sample Size | Sample Minimum 10 x 10 mm Maximum 100 x 120 mm Reference Minimum 10 x 10 mm Maximum 20 x 20 mm |
| Beam Port Diameter | 7 mm (4 mm, 2 mm as option) |
| Angle of Incidence | Approx. 5° (standard) other angles available on request. |
| Reflection Reference | Aluminum-deposited plane mirror (Standard mirror) |
Optional Accessories:
- Polarizer (GPH-506)
- Application program (film thickness calculation program, etc.)
- Sample stage with 2-mm-dia. port
- Sample stage with 4-mm-dia. port
MSK-001 Sample Stage with 2-mm-dia. Port
MSK-002 Sample Stage with 4-mm-dia. Port
| MSK-001 Sample Stage with 2-mm-dia.port | MSK-002 Sample stage with 4-mm-dia.port | ||
|---|---|---|---|
| Diameter of Port: | 2mm | Diameter of port: | 4mm |
| Sample Size: | Minimum 3x3 mm | Sample size: | Minimum 5x5 mm |
| Maximum 50x50 mm | Maximum 50x50 mm | ||
SLM-908 Accessory for 6-inch Silicon Wafers (V-750/760/770/780)
