UV-Visible Microspectrometer Specifications

Model	MSV-5500	MSV-5700	MSV-5800
Optical System	Double beam single monochromator Czerny-Turner mount
Light Source	30W Deuterium lamp, 20W Halogen lamp
Light Source (Option)	150W Xenon lamp (air-cooled)
Wavelength Range	200 - 900 nm	200 - 2700 nm	200 - 1600 nm
Wavelength Accuracy	± 0.3 nm (656.1 nm)	± 0.3 nm (656.1 nm) ± 1.5 nm (1312.2 nm)
Spectral Bandwidth	1, 2, 5, 10, L2, L5, L10 nm	1, 2, 5, 10, L2, L5, L10 nm (UV/Vis) 4, 8, 20, 40, L8, L20, L40 nm (NIR)	1, 2, 5, 10, L2, L5, L10 nm (UV/Vis) 2, 4, 10, 20, L4, L10, L20 nm (NIR)
Scan Modes	Continuous scan, step scan
Detector	PMT	PMT Peltier-cooled PbS	PMT Peltier-cooled InGaAs
Sample Observation	High resolution CMOS camera (1600 × 1200 pixel), optical zoom, ATOS feature, LED illumination
Sample Observation (Option)	Binocular, polarized observation, objective lens
Objective	Cassegrain objective, ×10, ×16, ×32 selectable *1
Condenser Mirror	Cassegrain collection mirror, ×10, ×16, ×32 user-interchangeable *1 (Automated condenser mirror compensation function)
Aperture	User-selectable dual-aperture settings for circular and rectangular (slit type) apertures 10, 20, 30, 50, 100, 200 µm (×16 objective) 5, 10, 15, 25, 50, 100 µm (×32 objective) 16, 32, 48, 80, 160, 320 µm (×10 objective)
Sample Stage	Manual stage (working area: X 50 × Y 75 × Z 20 mm) *2
Sample Stage (Option)	Auto stage (working area: X 76 × Y 52 × Z 25 mm, 1 µm step) *2, joystick (option)
Polarizer	Glan-Taylor, automatic insertion/angle setting
Analyzer (Option):	Glan-Taylor, automatic insertion/angle setting
Control Panel	Cassegrain switching and indicator, transmittance/reflectance mode indicator, aperture selection, measurement start/stop, auto focus, automatic condenser mirror compensation, optical zoom, automated sample illumination, sample compartment illumination ON/OFF, ATOS illumination ON/OFF
Dimensions	700 (W) × 740 (D) × 640 (H) mm
Weight	105 kg
Power Requirement	150 VA
Software	Spectra Manager™
OS	Windows10 and 11 Professional and Enterprise
Program	Microscope Measurement (multi-point measurement, line and lattice mapping), Micro Spectra Analysis, Spectra Analysis (data processing such as film thickness calculation, color calculation, peak detection, derivatives), Time-Course Measurement, Validation, JASCO Canvas, Administrative Tools
Program (Option) *3	Fixed wavelength mapping (line and lattice mode), auto focus, multi-image