UV-Visible Microspectrometer Specifications

Model
MSV-5500
MSV-5700
MSV-5800
Optical System

Double beam single monochromator Czerny-Turner mount
Light Source
30W Deuterium lamp, 20W Halogen lamp
Light Source (Option)

150W Xenon lamp (air-cooled)
Wavelength Range
200 - 900 nm
200 - 2700 nm
200 - 1600 nm
Wavelength Accuracy
± 0.3 nm (656.1 nm)

± 0.3 nm (656.1 nm)

± 1.5 nm (1312.2 nm)
Spectral Bandwidth
1, 2, 5, 10, L2, L5, L10 nm
1, 2, 5, 10, L2, L5, L10 nm (UV/Vis)

4, 8, 20, 40, L8, L20, L40 nm (NIR)
1, 2, 5, 10, L2, L5, L10 nm (UV/Vis)

2, 4, 10, 20, L4, L10, L20 nm (NIR)
Scan Modes

Continuous scan, step scan
Detector
PMT
PMT

Peltier-cooled PbS
PMT

Peltier-cooled InGaAs
Sample Observation

High resolution CMOS camera (1600 × 1200 pixel), optical zoom, ATOS feature, LED illumination
Sample Observation (Option)

Binocular, polarized observation, objective lens
Objective

Cassegrain objective, ×10, ×16, ×32 selectable *1
Condenser Mirror

Cassegrain collection mirror, ×10, ×16, ×32 user-interchangeable *1

(Automated condenser mirror compensation function)
Aperture

User-selectable dual-aperture settings for circular and rectangular (slit type) apertures

10, 20, 30, 50, 100, 200 µm (×16 objective)

5, 10, 15, 25, 50, 100 µm (×32 objective)

16, 32, 48, 80, 160, 320 µm (×10 objective)
Sample Stage

Manual stage (working area: X 50 × Y 75 × Z 20 mm) *2
Sample Stage (Option)

Auto stage (working area: X 76 × Y 52 × Z 25 mm, 1 µm step) *2, joystick (option)
Polarizer

Glan-Taylor, automatic insertion/angle setting
Analyzer (Option):

Glan-Taylor, automatic insertion/angle setting
Control Panel

Cassegrain switching and indicator, transmittance/reflectance mode indicator, aperture selection,

measurement start/stop, auto focus, automatic condenser mirror compensation, optical zoom,

automated sample illumination, sample compartment illumination ON/OFF, ATOS illumination ON/OFF
Dimensions

700 (W) × 740 (D) × 640 (H) mm
Weight

105 kg
Power Requirement

150 VA
Software
Spectra Manager™
OS
Windows10 and 11 Professional and Enterprise
Program

Microscope Measurement (multi-point measurement, line and lattice mapping), Micro Spectra Analysis, Spectra Analysis (data processing such as film thickness calculation, color calculation, peak detection, derivatives), Time-Course Measurement, Validation, JASCO Canvas, Administrative Tools
Program (Option) *3

Fixed wavelength mapping (line and lattice mode), auto focus, multi-image