Film thickness measurement can be measured using a number of different techniques depending on the thickness and number of layers. In its simplest form a simple measurement can be made of a single layer with a reflective lower surface using interference fringes. For more complex materials with multiple layers interference measurement is still made, but the mathematical deconvolution becomes increasingly important as does the refractive index of each layer.
MENUMENU
- Products
- Chromatography
- Molecular Spectroscopy
- Circular Dichroism
- High-Throughput CD
- Vibrational CD
- Circularly Polarized Luminescence (CPL)
- Polarimeters
- FTIR Spectrometers
- FTIR Microscopy
- FTIR Portable
- Raman Microscopy
- Palmtop Raman Spectrometer
- Probe Raman
- UV-Visible/NIR Spectrophotometers
- UV-Visible/NIR Microscopy
- Fluorescence Spectrophotometers
- Film Thickness
- Spectra Manager™ Suite
- Refurbished
- Service
- Applications
- KnowledgeBase
- Learning Center
- About Us
- News
- Events
- Worldwide
- Shop
- My Account
- Contact Us