Applications
ReferenceYearTechnique Title
Evaluation of a Luminescent Semiconductor on the Nanometer Scale
Transmittance Near-field measurements in the UV-visible/NIR range at 0.1 to 1 µm spatial resolution
Infrared measurements with 1 µm spatial resolution
Optical Evaluation of Write Spots in a CD-R by Transmittance Measurement
Nanometer scale characterization of a GaAsP semiconductor
Measurement of the Transition Process of a Semiconductor
190-UV-0025
2012
UV-Visible/NIR, UV-Visible/NIR Microscopy
Evaluation of Micro Optics
Evaluation of Polarizers for FPDs
Phase Difference Measurements
Luminescent Color Evaluation for Fluorescent Materials
Evaluation of ITO Films
Analysis of Fluorescence Materials at High Temperatures
Raman for the evaluation of carrier concentrations in GaN
Evaluation of Polysilicon
Single-Layer Carbon Nanotube
Evaluation of Carbon Materials
Evaluation of Diamond Like Carbon (DLC)
Semiconductor Stress Measurement
220-AT-0222
2011