220-AT-0222 2011 FTIR FTIR Analysis of Si Wafer Surface Using a 65-Degree Incident Angle ATR FTIR Analysis of Si Wafer Surface Using a 65-Degree Incident Angle ATR Carlos Morillo January 4, 2024
100-AT-0227B 2011 FTIR Measurement of Oriented Films and Liquid Crystal Molecules by a Polarized ATR Accessory Measurement of Oriented Films and Liquid Crystal Molecules by a Polarized ATR Accessory Keisuke Watanabe January 4, 2024
140-AT-0221 2010 FTIR Terahertz ATR Measurement of Liquids by Vacuum FTIR Terahertz ATR Measurement of Liquids by Vacuum FTIR Kohei Tamura January 4, 2024
220-TR-0164 ~1999 FTIR Analysis of silicon wafers by vacuum FTIR Analysis of silicon wafers by vacuum FTIR Carlos Morillo January 5, 2024
Nanospectroscopy using a Near-Field Scanning Microspectrometer Nanospectroscopy using a Near-Field Scanning Microspectrometer Heather Haffner August 25, 2022