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Home / Applications / Material Analysis

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  • Technique

Applications

ReferenceYearTechnique Title

100-AT-0227B

2011

FTIR

Measurement of Oriented Films and Liquid Crystal Molecules by a Polarized ATR Accessory

Measurement of Oriented Films and Liquid Crystal Molecules by a Polarized ATR Accessory
Keisuke Watanabe January 4, 2024

140-AT-0221

2010

FTIR

Terahertz ATR Measurement of Liquids by Vacuum FTIR

Terahertz ATR Measurement of Liquids by Vacuum FTIR
Kohei Tamura January 4, 2024

220-TR-0164

~1999

FTIR

Analysis of silicon wafers by vacuum FTIR

Analysis of silicon wafers by vacuum FTIR
Carlos Morillo January 5, 2024

Nanospectroscopy using a Near-Field Scanning Microspectrometer

Nanospectroscopy using a Near-Field Scanning Microspectrometer
Heather Haffner August 25, 2022
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