Applications
ReferenceYearTechnique Title
Field-rugged FTIR for in-situ monitoring of chemical vapor deposition (CVD)
Using a 785nm laser to reduce fluorescence in Raman analysis of a contaminant in a film
Confocal Raman imaging microscopy for non-destructive analysis of impurities in polymers
FTIR Linear Array Microscope for Qualitative Analysis of Semiconductor Contaminants
Contaminant analysis using FTIR microscopy
Raman for the evaluation of carrier concentrations in GaN
Evaluation of Polysilicon
Single-Layer Carbon Nanotube
Evaluation of Carbon Materials
Evaluation of Diamond Like Carbon (DLC)
Semiconductor Stress Measurement
FTIR Microscopy for the Analysis of Polymer Laminates in Beverage Packaging
Analysis of Automotive Fluids using FTIR with an ATR Accessory
Confocal Raman Imaging – Using Spectroscopy for Materials Analysis and Chemical Distribution
FT/IR-4000 and FT/IR 6000 Series FTIR Instrument Validation Software
220-AT-0222
2011
FTIR Analysis of Si Wafer Surface Using a 65-Degree Incident Angle ATR
100-AT-0227B
2011
Measurement of Oriented Films and Liquid Crystal Molecules by a Polarized ATR Accessory
140-AT-0221
2010
Terahertz ATR Measurement of Liquids by Vacuum FTIR
200-DR-0188
2007