Applications
Found 334 Results / Page 13 of 17
ReferenceYear Technique Title
Transmittance Near-field measurements in the UV-visible/NIR range at 0.1 to 1 µm spatial resolution
Infrared measurements with 1 µm spatial resolution
Optical Evaluation of Write Spots in a CD-R by Transmittance Measurement
Nanometer scale characterization of a GaAsP semiconductor
Measurement of the Transition Process of a Semiconductor
190-UV-0025
2012
UV-Visible/NIR, UV-Visible/NIR Microscopy