Applications
Found 361 Results / Page 14 of 19
ReferenceYear Technique Title
Using a 785nm laser to reduce fluorescence in Raman analysis of a contaminant in a film
Confocal Raman imaging microscopy for non-destructive analysis of impurities in polymers
FTIR Linear Array Microscope for Qualitative Analysis of Semiconductor Contaminants
Highly Accurate Measurements in the Vacuum UV Region
Time-Resolved Measurements of Liquid Crystals
Photoelastic Constant Measurements
Evaluation of a Luminescent Semiconductor on the Nanometer Scale
Transmittance Near-field measurements in the UV-visible/NIR range at 0.1 to 1 µm spatial resolution
Infrared measurements with 1 µm spatial resolution
Optical Evaluation of Write Spots in a CD-R by Transmittance Measurement
Nanometer scale characterization of a GaAsP semiconductor
Measurement of the Transition Process of a Semiconductor
190-UV-0025
2012
UV-Visible/NIR, UV-Visible/NIR Microscopy