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Found 328 Results / Page 12 of 17

ReferenceYear Technique Title

Raman Analysis of Injection Molding -measurement of the polymer state during a process

Raman Analysis of Injection Molding -measurement of the polymer state during a process

Leah Pandiscia, PhD August 22, 2022

On-Line FTIR monitoring with a field-rugged spectrometer with fiber-optic cable

On-Line FTIR monitoring with a field-rugged spectrometer with fiber-optic cable

Carlos Morillo August 22, 2022

Field-rugged FTIR for in-situ monitoring of chemical vapor deposition (CVD)

Field-rugged FTIR for in-situ monitoring of chemical vapor deposition (CVD)

Carlos Morillo August 23, 2022

Color Analysis of Fluorescence Materials for FPD

Color Analysis of Fluorescence Materials for FPD

Leah Pandiscia, PhD August 23, 2022

Monitoring of Polysilicon Crystallization Using a Laser

Monitoring of Polysilicon Crystallization Using a Laser

Leah Pandiscia, PhD August 23, 2022

UV-Visible Diode-Array Spectrophotometer for In-Line Monitoring for QC

UV-Visible Diode-Array Spectrophotometer for In-Line Monitoring for QC

Leah Pandiscia, PhD August 23, 2022

On-line Monitoring of an Amorphous Silicon Layer on a Solar Cell

On-line Monitoring of an Amorphous Silicon Layer on a Solar Cell

Leah Pandiscia, PhD August 23, 2022

Contaminant Identification on Circuit Boards Using a Near-Field IR Spectrometer

Contaminant Identification on Circuit Boards Using a Near-Field IR Spectrometer

Leah Pandiscia, PhD August 23, 2022

Using a 785nm laser to reduce fluorescence in Raman analysis of a contaminant in a film

Using a 785nm laser to reduce fluorescence in Raman analysis of a contaminant in a film

Leah Pandiscia, PhD August 23, 2022

Confocal Raman imaging microscopy for non-destructive analysis of impurities in polymers

Confocal Raman imaging microscopy for non-destructive analysis of impurities in polymers

Leah Pandiscia, PhD August 23, 2022

FTIR, FTIR Microscopy

FTIR Linear Array Microscope for Qualitative Analysis of Semiconductor Contaminants

FTIR Linear Array Microscope for Qualitative Analysis of Semiconductor Contaminants

Carlos Morillo August 23, 2022

Highly Accurate Measurements in the Vacuum UV Region

Highly Accurate Measurements in the Vacuum UV Region

Leah Pandiscia, PhD August 23, 2022

Time-Resolved Measurements of Liquid Crystals

Time-Resolved Measurements of Liquid Crystals

Leah Pandiscia, PhD August 23, 2022

Photoelastic Constant Measurements

Photoelastic Constant Measurements

Leah Pandiscia, PhD August 23, 2022

Evaluation of a Luminescent Semiconductor on the Nanometer Scale

Evaluation of a Luminescent Semiconductor on the Nanometer Scale

Leah Pandiscia, PhD August 23, 2022

Transmittance Near-field measurements in the UV-visible/NIR range at 0.1 to 1 µm spatial resolution

Transmittance Near-field measurements in the UV-visible/NIR range at 0.1 to 1 µm spatial resolution

Leah Pandiscia, PhD August 23, 2022

Infrared measurements with 1 µm spatial resolution

Infrared measurements with 1 µm spatial resolution

Leah Pandiscia, PhD August 23, 2022

Optical Evaluation of Write Spots in a CD-R by Transmittance Measurement

Optical Evaluation of Write Spots in a CD-R by Transmittance Measurement

Leah Pandiscia, PhD August 23, 2022

Nanometer scale characterization of a GaAsP semiconductor

Nanometer scale characterization of a GaAsP semiconductor

Leah Pandiscia, PhD August 23, 2022

Measurement of the Transition Process of a Semiconductor

Measurement of the Transition Process of a Semiconductor

Leah Pandiscia, PhD August 23, 2022

Page 12 of 17

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