Applications
ReferenceYear Technique Title
Measurement of the Transition Process of a Semiconductor
190-UV-0025
2012
UV-Visible/NIR, UV-Visible/NIR Microscopy
Evaluation of Micro Optics
Evaluation of Polarizers for FPDs
Phase Difference Measurements
Contaminant analysis using FTIR microscopy
Luminescent Color Evaluation for Fluorescent Materials
Evaluation of ITO Films
Analysis of Fluorescence Materials at High Temperatures
Raman for the evaluation of carrier concentrations in GaN
Evaluation of Polysilicon
Single-Layer Carbon Nanotube
Evaluation of Carbon Materials
Evaluation of Diamond Like Carbon (DLC)
Semiconductor Stress Measurement
Myoglobin Secondary Structure Measurement using Circular Dichroism with Automated pH Titration
Circular Dichroism Spectrometry for the Analysis of Amphetamines
Circular Dichroism, Fluorescence
Fluorescence and CD Spectra using the Temperature/Wavelength Measurement
CD Spectrum Measurement Using HTCD System
210-CD-0013
2011