Chromatography, Spectroscopy & Material Science Applications | JASCO Inc.

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ReferenceYear Technique Title

Raman Analysis of Injection Molding -measurement of the polymer state during a process

On-Line FTIR monitoring with a field-rugged spectrometer with fiber-optic cable

Field-rugged FTIR for in-situ monitoring of chemical vapor deposition (CVD)

Color Analysis of Fluorescence Materials for FPD

Monitoring of Polysilicon Crystallization Using a Laser

UV-Visible Diode-Array Spectrophotometer for In-Line Monitoring for QC

On-line Monitoring of an Amorphous Silicon Layer on a Solar Cell

Contaminant Identification on Circuit Boards Using a Near-Field IR Spectrometer

Using a 785nm laser to reduce fluorescence in Raman analysis of a contaminant in a film

Confocal Raman imaging microscopy for non-destructive analysis of impurities in polymers

FTIR, FTIR Microscopy

FTIR Linear Array Microscope for Qualitative Analysis of Semiconductor Contaminants

Highly Accurate Measurements in the Vacuum UV Region

Time-Resolved Measurements of Liquid Crystals

Photoelastic Constant Measurements

Evaluation of a Luminescent Semiconductor on the Nanometer Scale

Transmittance Near-field measurements in the UV-visible/NIR range at 0.1 to 1 µm spatial resolution

Infrared measurements with 1 µm spatial resolution

Optical Evaluation of Write Spots in a CD-R by Transmittance Measurement

Nanometer scale characterization of a GaAsP semiconductor

Measurement of the Transition Process of a Semiconductor